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Browsing by Author "Iwasaki, Akihisa"

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    BEOL pre-metallization wet clean: post-etch residue removal and metal compatibility

    Le, Quoc Toan  
    ;
    Kesters, Els  
    ;
    Akanishi, Yuya  
    ;
    Iwasaki, Akihisa
    ;
    Holsteyns, Frank  
    Meeting abstract
    2018, Surface Preparation and Cleaning Conference - SPCC, 9/04/2018
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    Controlled ALE-type recess of molybdenum for future logic and memory applications

    Pacco, Antoine  
    ;
    Teppei, Nakano
    ;
    Iwasaki, Akihisa
    ;
    Iwahata, Shota
    ;
    Altamirano Sanchez, Efrain  
    Proceedings paper
    2021, IEEE International Interconnect Technology Conference (IITC), JUL 06-09, 2021
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    Development of an all-in one wet single wafer process for 3D-SIC bump integration and its monitoring

    Suhard, Samuel  
    ;
    Iwasaki, Akihisa
    ;
    Liebens, Maarten  
    ;
    Stiers, Karen  
    ;
    Slabbekoorn, John  
    Proceedings paper
    2016, IEEE 18th Electronics Packaging Technology Conference - EPTC, 30/11/2016, p.107-110
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    Etching of molybdenum via a combination of low-temperature ozone oxidation and wet-chemical oxide dissolution

    Pacco, Antoine  
    ;
    Nakano, Teppei
    ;
    Iwahata, Shota
    ;
    Iwasaki, Akihisa
    ;
    Altamirano Sanchez, Efrain  
    Journal article
    2023, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, (41) 3, p.Art. 032601
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    Impact of dissolved oxygen in dilute HF solution on material etch

    Kesters, Els  
    ;
    Iwasaki, Akihisa
    ;
    Le, Quoc Toan  
    ;
    Holsteyns, Frank  
    Proceedings paper
    2016, Ultra Clean Processing of Semiconductor Surfaces XIII - UCPSS, 11/09/2016, p.251-254
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    Integrated clean for TSV: comparison between dry process and wet processes and their electrical qualification

    Suhard, Samuel  
    ;
    Li, Yunlong  
    ;
    Iwasaki, Akihisa
    ;
    Van Huylenbroeck, Stefaan  
    ;
    Draper, Simon
    Proceedings paper
    2016, IEEE 18th Electronics Packaging Technology Conference - EPTC, 30/11/2016, p.441-444
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    Optimization of post etch cobalt compatible clean by pH and oxidizer

    Iino, H.
    ;
    Ogawa, Y.
    ;
    Masaoka, T.
    ;
    Le, Quoc Toan  
    ;
    Kesters, Els  
    ;
    Rip, Jens  
    ;
    Oniki, Yusuke  
    ;
    Akanishi, Y.
    Proceedings paper
    2018, Ultra Clean Processing of Semiconductor Surfaces XIV - UCPSS, 2/09/2018, p.268-272
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    Study of copper surface preparation by sequential atomic layer wet etching and laser annealing treatments

    Iwasaki, Akihisa
    ;
    Akanishi, Yuya  
    ;
    Matsumoto, Fulvio
    ;
    Kesters, Els  
    ;
    Le, Quoc Toan  
    Meeting abstract
    2017, 232nd ECS Fall Meeting: 15th International Symposium on Semiconductor Cleaning Science and Technology - SCST15, 1/10/2017, p.1079
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    Study of copper surface preparation by sequential atomic layer wet etching and laser annealing treatments

    Iwasaki, Akihisa
    ;
    Akanishi, Yuya  
    ;
    Mazzamuto, Fulvio
    ;
    Kesters, Els  
    ;
    Le, Quoc Toan  
    Proceedings paper
    2017, 232nd ECS Fall Meeting - 15th International Symposium on Semiconductor Cleaning Science and Technology - SCST15, 1/10/2017, p.233-241

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