Browsing by Author "Janssens, Koenraad"

Assessment of quantitative characterization of localized strain using electron diffraction contrast imaging

Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation

Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure

Electron microscopy techniques for the assessment of localised stress distributions in semiconductors

Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging

Localised Strain Characterization in Semiconductor Structures using Electron Diffraction Contrast Imaging

Localized strain characterization using electron diffraction contrast imaging

Nanoscale strain characterization using transmission electron microscopy: The software package SIMCON

On the characterization of the strain field of lattice defects in silicon with nanometer resolution

On the TEM assessment of local strain distributions in integrated circuit structures

Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited

Transmission electron diffraction techniques for nm scale strain measurement in semiconductors

Transmission electron diffraction techniques for nm scale strain measurements in semiconductors