Browsing by Author "Liu, Qianqian"

A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs

Alleviation of Negative-Bias Temperature Instability in Si p-FinFETs With ALD W Gate-Filling Metal by Annealing Process Optimization

Comparative study on NBTI kinetics in Si p-FinFETs with B2H6-based and SiH4-based atomic layer deposition tungsten (ALD W) filling metal

Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs

Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs

Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress