Browsing by Author "Magnone, P."
- Results Per Page
- Sort Options
Publication 1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Journal article2009, IEEE Transactions on Device and Materials Reliability, (9) 2, p.180-189Publication A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Proceedings paper2008, 9th European Workshop on Ultimate Integration of Silicon - ULIS, 12/03/2008, p.141-144Publication Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Journal article2009, Journal of Applied Physics, (106) 7, p.73710Publication Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Proceedings paper2009, 2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST, 1/06/2009Publication Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks
Journal article2007, Microelectronics Reliability, (47) 4_5, p.501-504Publication Modeling the gate current 1/f noise and its application to advanced CMOS devices
Proceedings paper2008, 9th International Conference on Solid-State and Integrated-Circuit Technology - IC-SICT, 20/10/2008, p.420-423Publication Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
Journal article2016, IEEE Transactions on Electron Devices, (63) 2, p.723-730Publication The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Proceedings paper2009, Silicon Nitride, Silicon Dioxide, and Alternate Emerging Dielectrics 10, 24/05/2009, p.87-99Publication The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Meeting abstract2009, 215th ECS Meeting, 24/05/2009Publication Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Journal article2009, IEEE Transactions on Electron Devices, (56) 5, p.1063-1069Publication Understanding the potential and the limits of germanium pMOSFETs for VLSI circuits from experimental measurements
Journal article2011, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (19) 9, p.1569-1582