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Browsing by Author "Mankelevich, Y."

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    Applications of cryogenic plasma etching for microtechnology and advanced CMOS manufacturing

    Dussart, R.
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    Lefaucheux, P.
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    Tillocher, T.
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    Ranson, P.
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    Boufnichel, M.
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    Ljazouli, R.
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    Zhang, Liping  
    Meeting abstract
    2013, Plasma Etch and Strip in Microtechnology - PESM, 14/03/2013
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    Damage free cryogenic etching of a porous organosilica ultralow-k film

    Zhang, Liping  
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    Leffaucheux, P.
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    Tillocher, T.
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    Dussart, R.
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    Mankelevich, Y.
    Journal article
    2013, Electrochemical and Solid-State Letters, (2) 2, p.N5-N7
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    Effect of VUV and EUV radiation on utra low-k materials damage

    Braginsky, O.
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    Kovalev, A.
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    Lopaev, D.
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    Mankelevich, Y.
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    Proshina, O.
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    Rakhimova, T.
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    Rakhimov, A.
    Proceedings paper
    2013, Advanced Interconnects for Micro- and Nanoelectronics - Materials, Processes, and Reliability, 1/04/2013, p.AA03.11
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    F atoms interaction with nanoporous OSG low-k materials

    Rakhimova, T.
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    Rakhimov, A.
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    Zyryanov, S.
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    Lopaev, D.
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    Mankelevich, Y.
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    Proshina, O.
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    Novikova, N.
    Meeting abstract
    2014, MRS Spring Meeting Symposium CC: New Materials and Processes for Interconnects, Novel Memory and Advanced Display Technologies, 15/03/2014, p.CC1.03-283
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    Interaction of atomic fluorine with porous low-k SiCOH films: modeling

    Palov, A.
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    Voronina, E.
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    Lopaev, D.
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    Mankelevich, Y.
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    Rakhimova, T.
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    Zyryanov, S.
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    Proshina, O.
    Oral presentation
    2015, 22nd International Symposium on Plasma Chemistry - ISPC
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    Interaction of F atoms with SiCOH ultra low-k films. Part I: Fluorination and damage

    Rakhimova, T.
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    Lopaev, D.
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    Mankelevich, Y.
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    Rakhimov, A.
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    Zyryanov, S.
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    Kurchikov, K.
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    Novikova, N.
    Journal article
    2015, Journal of Physics D: Applied Physics, (48) 17, p.175203
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    Interaction of F atoms with SiCOH ultra low-k films. Part II: Etching

    Rakhimova, T.
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    Lopaev, D.
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    Mankelevich, Y.
    ;
    Kurchikov, K.
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    Zyryanov, S.
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    Palov, A.P.
    Journal article
    2015, Journal of Physics D: Applied Physics, (48) 17, p.175204
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    Low-k OSG damage and etching by F atoms at lowered temperatures

    Zyryanov, S.
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    Kurchikov, D.
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    Lopaev, D.
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    Mankelevich, Y.
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    Palov, A.
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    Rakhimova, T.
    ;
    Voronina, E.
    Oral presentation
    2015, 22nd International Symposium on Plasma Chemistry - ISPC
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    Modelling degradation of PTFE under electron irradiation

    Palov, A.
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    Fujii, H.
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    Mankelevich, Y.
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    Rakhimova, T.
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    Baklanov, Mikhaïl
    Journal article
    2012, Polymer Degradation and Stability, (97) 5, p.802-809
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    Modification of OSG based low-k films under EUV and VUV exposure

    Rakhimova, T.
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    Rakhimov, A.
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    Mankelevich, Y.
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    Lopaev, D.
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    Kovalev, A.
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    Vasil'eva, A.
    ;
    Proshina, O.
    Journal article
    2013, Applied Physics Letters, 102, p.111902
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    Multi-step reaction mechanism for F atom interactions with organosilicate glass and SiOx films

    Mankelevich, Y.
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    Voronina, E.
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    Rakhimova, T.
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    Palov, A.
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    Lopaev, D.V.
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    Zyryanov, S.M.
    Journal article
    2016, Journal of Physics D: Applied Physics, (49) 34, p.345203
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    Ultra low-k dielectrics damage under VUV and EUV radiation

    Zyryanov, S.
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    Braginsky, O.
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    Kovaev, A.
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    Lopaev, D.
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    Mankelevich, Y.
    ;
    Rakhimova, T.
    ;
    Rakhimov, A.
    Meeting abstract
    2012, 65th Gaseous Electronics Conference, 22/10/2012, p.CT2.00005

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