Browsing by Author "Moens, P."

A comprehensive model for hot carrier degradation in LDMOS transistors

A fast and flexible thermal simulation tool validated on smart power devices

A new lateral-IGBT structure with a wider safe operating area

A new LIGBT structure to suppress substrate currents in a junction isolated technology

A novel hot-hole injection degradation model for lateral nDMOS transistors

A novel model for boron diffusion in SiGe strained layers based on a kinetic driven Ge-B pairing mechanism

A physical-statistical approach to AlGaN/GaN HEMT reliability

A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistors

An ultrafast and latch-up free lateral IGBT with hole diverter for junction-isolated technologies

Analysis of a narrow-base laterel IGBT with double buried layer for junction-isolated smart-power technologies

Breakdown and hot carrier injection in deep trench isolation structures

Calibration during the TCAD development of a high voltage pDEMOS in a sub-μm CMOS technology

Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors

Cost effective implementation of a 90 V RESURF P-type drain extended MOS in a 0.35 μm based smart power technology

Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization

Dynamic-ron control via proton irradiation in AlGaN/GaN transistors

Effect of the n+-sinker in self-triggered bipolar ESD protection structures

ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping

Evidence for source-side injection hot carrier effects on lateral DMOS transistors

Evidence for source-side injection hot carrier effects on lateral DMOS transistors