Browsing by Author "Nafria, Montse"

Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain

Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

Gate voltage influence on the channel hot-carrier degradation of high-k-based devices

Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions

New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices

Processing dependences of CHC degradation on strained-Si pMOSFETs

SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors