Browsing by Author "Paccagnella, A."

A statistical approach to microdose induced degradation in FinFET devices

Depassivation of latent plasma damage in nMOSFETs

Different nature of process-induced and stress-induced defects in thin SiO2 layers

Dynamic-ron control via proton irradiation in AlGaN/GaN transistors

Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques

Electrical stresses on ultra-thin gate oxide SOI MOSFETs after irradiation

Heavy ion damage in ultra-thin gate oxide SOI MOSFETs

Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetime

Impact of radiation on the operation and reliability of deep submicron CMOS technologies

Microdose and breakdown effects induced by heavy ions on sub 20-nm triple gate SOI FETs

Study of breakdown effects in silicon multiguard structures

The impact of plasma-charging damage on the RF performance of deep-submicron MOSFET