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Browsing by Author "Profijt, Harald"

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    Advanced processes for Si:P and Si:C:P epitaxial growth and low-temperature surface cleaning

    Profijt, Harald
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    Rosseel, Erik  
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    Tolle, John
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    Weeks, K.D.
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    Loo, Roger  
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    Mehta, Sandeep
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    Maes, Jan  
    Meeting abstract
    2014-11, Workshop on Atomically Controlled Processing for Ultra-large Scale Integration, 13/11/2014
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    Catalyst assisted low temperature pre epitaxial cleaning for Si and SiGe surfaces

    Dhayalan, Sathish Kumar
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    Loo, Roger  
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    Hikavyy, Andriy  
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    Rosseel, Erik  
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    Wostyn, Kurt  
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    Kenis, Karine  
    Proceedings paper
    2015, Ultraclean Processing of Semiconductor Surfaces XII, 21/09/2014, p.16-19
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    Characterization of epitaxial Si:C:P and SI:P layers for source/drain formation in advanced bulk FinFETs

    Rosseel, Erik  
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    Profijt, Harald
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    Hikavyy, Andriy  
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    Tolle, John
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    Kubicek, Stefan  
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    Mannaert, Geert  
    Proceedings paper
    2014-10, SiGe, Ge, and Related Compounds 6: Materials, Processing, and Devices, 5/10/2014, p.977-987
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    Characterization of epitaxial Si:C:P and Si:P layers for source/drain formation in advanced bulk finFETs

    Rosseel, Erik  
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    Profijt, Harald
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    Hikavyy, Andriy  
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    Tolle, John
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    Kubicek, Stefan  
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    Mannaert, Geert  
    Meeting abstract
    2014-10, ECS Fall Meeting Symposium: SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 6, 5/10/2014, p.1855
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    Fundamentals of Ge1-xSnx and SiyGe1-x-ySnx RPCVD epitaxy

    Margetis, Joe
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    Mosleh, Aboozar
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    Ghetmiri, Seyed Amir
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    Al-Kabi, Sattar
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    Dou, Wei
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    Du, Wei
    Journal article
    2017, Material Science in Semiconcductor Processing, 70, p.38-43
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    Ge1-xSnx and SiyGe1-x-ySnx epitaxy on a commercial CVD reactor

    Margetis, Joe
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    Mosleh, Aboozar
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    Ghetmiri, Seyed Amir
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    Bhargava, Nupur
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    Yu, Shui-Qing
    Meeting abstract
    2016-05, 7th International Symposium on Control of Semiconductor Interfaces / International Si Technology and Device Meeting, 7/06/2016, p.4-5
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    HF-last wet clean in combination with a low temperature GeH4-assisted HCl in-situ clean prior to Si0.8Ge0.2-on-Si epitaxial growth

    Wostyn, Kurt  
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    Dhayalan, Sathish Kumar
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    Hikavyy, Andriy  
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    Loo, Roger  
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    Douhard, Bastien  
    Proceedings paper
    2014, Ultra Clean Processing of Semiconductor Surfaces XII, 21/09/2014, p.20-23
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    Low temperature pre-epi Treatment: critical parameters to control interface contamination

    Hikavyy, Andriy  
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    Loo, Roger  
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    Dhayalan, Sathish Kumar
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    Wostyn, Kurt  
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    Rosseel, Erik  
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    Simoen, Eddy  
    Meeting abstract
    2013, E-MRS Fall Meeting Symposium A: Alternative Semiconductor Integration in Si Microelectronics, 16/09/2013
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    Low-temperature pre-epitaxy surface cleaning of Si and SiGe

    Profijt, Harald
    ;
    Suhard, Samuel  
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    Rosseel, Erik  
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    Tolle, John
    ;
    Mertens, Hans  
    Meeting abstract
    2015-05, 9th International Conference on Silicon Epitaxy and Heterostructures - ICSI9, 17/05/2015, p.143-144
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    Selective epitaxial growth of high-P Si:P for dource/drain formation in advanced Si nFETs

    Rosseel, Erik  
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    Dhayalan, Sathish Kumar
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    Hikavyy, Andriy  
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    Loo, Roger  
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    Profijt, Harald
    Proceedings paper
    2016, SiGe, Ge, and Related Materials: Materials, Processing, and Devices 7, 2/10/2016, p.347-359
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    Selective epitaxial growth of high-P Si:P for dource/drain formation in advanced Si nFETs

    Rosseel, Erik  
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    dhayalan,
    ;
    Hikavyy, Andriy  
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    Loo, Roger  
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    Profijt, Harald
    ;
    Kohen, David
    Meeting abstract
    2016, PRiME 2016 - 230th ECS Meeting (Fall) - Electrochemical Society: SiGe, Ge & Related Compounds: Materials, Processing and Devices, 2/10/2016, p.2003

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