Browsing by Author "Ruiz Aguado, Daniel"

A novel trapping/detrapping model for defect profiling in high-k materials using the two-pulse capacitance-voltage technique

Analysis and modeling of new dielectric materials

Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability

Defect profiling in the SiO2/Al2O3 interface using variable Tcharge-Tdischarge amplitude charge pumping (VT2ACP)

Energy and spatial distributions of electron traps throughout Sio2/Al2O3 stacks as the IPD in flash memory application

Impact of the high-temperature process steps on the HfAIO interpoly dielectric stacks for nonvolatile memory applications

Investigation of aggressively scaled HfALOx-based interpoly dielectric stacks for sub-45nm nonvolatile memory technologies

Performance and reliability of HfALOx-based interpoly dielectrics for floating-gate flash memory

The Flash Memory for the nodes to come: material issues from a device perspective

Two-pulse C-V: a new method for characterization electron traps in the bulk of SiO2/high-k dielectric stacks