Browsing by Author "Sangiorgi, E."

Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate

Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition

P-GaN Gate HEMTs: A Solution to Improve the High-Temperature Gate Lifetime

Reduced self-heating by strained silicon substrate engineering

Reduced self-heating by strained silicon substrate engineering

Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress

TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs

The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs