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Browsing by Author "Spampinato, Valentina"

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    3D analysis of intermetallic formation in blankets and micro-bumps

    Spampinato, Valentina  
    ;
    Franquet, Alexis  
    ;
    Barnes, Jean-Paul
    Proceedings paper
    2019, Réunion des Utilisateurs Francophones ToF-SIMS - ION TOF, 14/03/2019
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    3D analysis of intermetallic formation in blankets and micro-bumps.

    Spampinato, Valentina  
    ;
    Franquet, Alexis  
    ;
    Barnes, Jean-Paul
    ;
    Conard, Thierry  
    Oral presentation
    2019, SIMS 22
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    50 nm Gate Length FinFET Biosensor & the Outlook for Single-Molecule Detection

    Santermans, Sybren  
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    Barge, David  
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    Hellings, Geert  
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    Bergfeld Mori, Carlos  
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    Migacz, Konrad Joseph  
    Proceedings paper
    2020, IEEE International Electron Devices Meeting (IEDM), DEC 12-18, 2020
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    A combined SPM/TOFSIMS tool to obtain real chemical 3D information

    Spampinato, Valentina  
    ;
    Dialameh, Masoud
    ;
    Fleischmann, Claudia  
    ;
    Franquet, Alexis  
    Meeting abstract
    2017, 21st International Conference on Secondary Ion Mass Spectrometry - SIMS21, 10/09/2017, p.304
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    A correlative ToF-SIMS/SPM methodology for probing 3D devices

    Spampinato, Valentina  
    ;
    Dialameh, Masoud  
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    Franquet, Alexis  
    ;
    Fleischmann, Claudia  
    Journal article
    2020, Analytical Chemistry, (92) 16, p.11413-11419
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    A flexible organic memory device with a clearly disclosed resistive switching mechanism

    Casula, Giulia
    ;
    Busby, Yan
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    Franquet, Alexis  
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    Spampinato, Valentina  
    ;
    Houssiau, Laurent
    Journal article
    2019, Organic Electronics, 64, p.209-215
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    A holistic approach of SIMS analysis for advanced semiconductor structures

    Franquet, Alexis  
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    Spampinato, Valentina  
    ;
    Pirkl, Alexander
    ;
    Kayser, Sven
    ;
    Moellers, Rudolf
    Proceedings paper
    2019, SIMS 22 - 22nd International Conference on Secondary Ion Mass Spectrometry, 20/10/2019
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    A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication

    Kruv, Anastasiia  
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    Gonzalez, Mario  
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    Okudur, Oguzhan Orkut  
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    Spampinato, Valentina  
    Journal article
    2022, MICROELECTRONIC ENGINEERING, (254) February, p.Art. 111660
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    Actual 3D analysis of hybrid arrays with in-situ SPM in a combined TOF-SIMS/SPM tool

    Spampinato, Valentina  
    ;
    Dialameh, Masoud  
    ;
    Fleischmann, Claudia  
    ;
    Franquet, Alexis  
    Oral presentation
    2018, SIMS Europe 2018
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    Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

    Franquet, Alexis  
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    Spampinato, Valentina  
    ;
    Kayser, Sven
    ;
    Vandervorst, Wilfried  
    Proceedings paper
    2019, French users meeting ToF-SIMS, 14/03/2019
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    Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

    Franquet, Alexis  
    ;
    Spampinato, Valentina  
    ;
    Kayser, Sven
    ;
    Havelund, Rasmus
    ;
    Gilmore, Ian
    Proceedings paper
    2018, SIMS Europe 2018, 16/09/2018
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    An alternative application of ToF-SIMS/in-situ AFM: controlled sample preparation for IC failure analysis

    Franquet, Alexis  
    ;
    Spampinato, Valentina  
    ;
    Khaled, Ahmad  
    ;
    Conard, Thierry  
    ;
    Brand, Sebastian
    Oral presentation
    2019, SIMS 22 - 22nd International Conference on Secondary Ion Mass Spectrometry
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    Applications of smart monomolecular films in IC microelectronics for organic-inorganic interface engineering

    Armini, Silvia  
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    Herregods, Sebastiaan  
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    Lecordier, Laurent
    ;
    Verheyen, Claudia
    ;
    Delande, Tinne  
    Meeting abstract
    2017, 43rd International Conference on Micro and Nanoengineering - MNE, 18/09/2017
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    Area-Selective Atomic Layer Deposition of TiN Using Trimethoxy(octadecyl)silane as a Passivation Layer

    Zheng, Li
    ;
    He, Wei
    ;
    Spampinato, Valentina  
    ;
    Franquet, Alexis  
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    Sergeant, Stefanie  
    ;
    De Gendt, Stefan  
    Journal article
    2020, LANGMUIR, (36) 44, p.13144-13154
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    Carbon nanotube EUV pellicle tunability and performance in a scanner-like environment

    Timmermans, Marina  
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    Pollentier, Ivan  
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    Korytov, Maxim  
    ;
    Nuytten, Thomas  
    ;
    Sergeant, Stefanie  
    Journal article
    2021, JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3, (20) 3, p.031010
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    Characterisation of nanomaterial hydrophobicity using engineered surfaces

    Desmet, Cloe
    ;
    Valsesia, Andrea
    ;
    Oddo, Arianna
    ;
    Ceccone, Giacomo
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    Spampinato, Valentina  
    Journal article
    2017, Journal of Nanoparticle Research, 19, p.117
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    Characterization of the conductive structures in the periplasm of cable bacteria using combined TOF-SIMS/AFM

    Thiruvallur Eachambadi, Raghavendran
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    Boschker, Henricus
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    Franquet, Alexis  
    Meeting abstract
    2018, SIMS Europe 2018, 17/09/2018
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    CNT EUV pellicle tunability and performance in a scanner-like environment

    Timmermans, Marina  
    ;
    Pollentier, Ivan  
    ;
    Korytov, Maxim  
    ;
    Nuytten, Thomas  
    ;
    Sergeant, Stefanie  
    Proceedings paper
    2021, Conference on Extreme Ultraviolet (EUV) Lithography XII, FEB 22-26, 2021, p.116090Y
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    Co active electrode enhances CBRAM performance and scaling potential

    Belmonte, Attilio  
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    Radhakrishnan, Janaki  
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    Donadio, Gabriele Luca  
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    Redolfi, Augusto  
    Meeting abstract
    2019, IEEE ELectron Devices Meeting - IEDM, 7/12/2019, p.851-854
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    [Co/Ni]-CoFeB hybrid free layer stack materials for high density magnetic random access memory applications

    Liu, Enlong
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    Swerts, Johan  
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    Couet, Sebastien  
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    Mertens, Sofie  
    ;
    Tomczak, Yoann  
    ;
    Lin, Tsann
    Journal article
    2016, Applied Physics Letters, (108) 13, p.132405
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