Browsing by author "Asenov, A."
Now showing items 1-9 of 9
-
Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions
Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W. D.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, A. (2014) -
Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM
Duan, M.; Zhang, J. F.; Manut, A.; Ji, Z.; Zhang, W.; Asenov, A.; Gerrer, L.; Reid, D.; Razaidi, H.; Vigar, D.; Chandra, V.; Aitken, R.; Kaczer, Ben; Groeseneken, Guido (2015) -
Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs
Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Mitard, Jerome; Ragnarsson, Lars-Ake; Witters, Liesbeth; Chiarella, Thomas; Togo, Mitsuhiro; Horiguchi, Naoto; Groeseneken, Guido; Bukhori, M.F.; Grasser, T.; Asenov, A. (2012) -
Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction
Meng, D.; Zhang, J. F.; Zhang, J. C.; Zhang, W.; Ji, Z.; Benbakhti, B.; Zheng, X. F.; Hao, Y.; Vigar, D.; Adamu-Lema, F.; Chandra, V.; Aitken, R.; Kaczer, Ben; Groeseneken, Guido; Asenov, A. (2017) -
Key issues and techniques for characterizing time-dependent device-to-device variation of SRAM
Duan, M.; Zhang, J. F.; Ji, Z.; Ma, J. G.; Zhang, W.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, A. (2013) -
Monte Carlo simulation study of hole mobility in germanium MOS inversion layers
Riddet, C.; Watling, J.R.; Chan, K.H.; Asenov, A.; De Jaeger, Brice; Mitard, Jerome; Meuris, Marc (2010) -
On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects
Kaczer, Ben; Amoroso, S. M.; Hussin, R.; Asenov, A.; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Grasser, T.; Rzepa, G.; Horiguchi, Naoto (2016) -
TEM analysis of Ge-on-Si MOSFET structures with HfO2 dielectric for high performance PMOS device technology
Norris, D.J.; Walther, T.; Cullis, A.G.; Myronov, M.; Dobbie, A.; Whall, T.; Parker, E.H.C.; Leadley, D.R.; De Jaeger, Brice; Lee, Willie; Meuris, Marc; Watling, J.; Asenov, A. (2010) -
Time-dependent variation: A new defect-based prediction methodology
Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Thean, Aaron; Groeseneken, Guido; Asenov, A. (2014)