Browsing by author "Goossens, Jozefien"
Now showing items 1-20 of 29
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Accurate carrier profiling of n-type GaAs junctions
Clarysse, Trudo; Brammertz, Guy; Vanhaeren, Danielle; Eyben, Pierre; Goossens, Jozefien; Clemente, Francesca; Meuris, Marc; Vandervorst, Wilfried; Srnanek, Rudolf; Kinder, Rudolf; Sciana, B.; Radziewicz, D.; Li, Zhiqiang (2008) -
Advanced 2D/3D simulations for laser annealed device using an atomic kinetic monte carlo approach and scanning spreading resistance microscopy (SRRM)
Noda, T.; Eyben, Pierre; Vandervorst, Wilfried; Vrancken, Christa; Rosseel, Erik; Ortolland, Claude; Clarysse, Trudo; Goossens, Jozefien; De Keersgieter, An; Felch, S.; Schreutelkamp, Rob; Absil, Philippe; Jurczak, Gosia; De Meyer, Kristin; Biesemans, Serge; Hoffmann, Thomas Y. (2008) -
Advanced phosphorus emitters for high efficiency Si solar cells
Janssens, Tom; Posthuma, Niels; Van Kerschaver, Emmanuel; Baert, Kris; Choulat, Patrick; Goossens, Jozefien; Vandervorst, Wilfried; Poortmans, Jef (2009) -
Advanced phosphorus emitters for high efficiency Si solar cells
Janssens, Tom; Posthuma, Niels; Van Kerschaver, Emmanuel; Baert, Kris; Choulat, Patrick; Everaert, Jean-Luc; Goossens, Jozefien; Vandervorst, Wilfried; Poortmans, Jef (2009) -
Basic aspects of the formation and activation of boron junctions using plasma immersion ion implantation
Zschaetzsch, Gerd; Vandervorst, Wilfried; Hoffmann, Thomas; Goossens, Jozefien; Everaert, Jean-Luc; del Agua Borniquel, Jose Ignacio; Poon, T. (2008) -
Depth resolution and surface transients in crystalline Silicon at ultra low energies
Goossens, Jozefien; Berghmans, Bart; Franquet, Alexis; Nguyen, Duy; Delmotte, Joris; Geenen, Luc; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2009-09) -
Electrical characterization of InGaAs ultra-shallow junctions
Petersen, Dirch H.; Hansen, Ole; Boggild, Peter; Lin, Rong; Nielsen, Peter F.; Lin, Dennis; Adelmann, Christoph; Alian, AliReza; Merckling, Clement; Penaud, Julien; Brammertz, Guy; Goossens, Jozefien; Vandervorst, Wilfried; Clarysse, Trudo (2009) -
Electrical characterization of InGaAs ultra-shallow junctions
Petersen, Dirch H.; Hansen, Ole; Bĝggild, Peter; Lin, Rong; Nielsen, Peter F.; Lin, Dennis; Adelmann, Christoph; Alian, AliReza; Merckling, Clement; Penaud, Julien; Brammertz, Guy; Goossens, Jozefien; Vandervorst, Wilfried; Clarysse, Trudo (2010) -
Experimental studies of dose retention and activation in fin field-effect-transistor-based structures
Mody, Jay; Duffy, Ray; Eyben, Pierre; Goossens, Jozefien; Moussa, Alain; Polspoel, Wouter; Berghmans, Bart; Van Dal, Mark; Pawlak, Bartek; Kaiser, Monja; Weemaes, R. G. R.; Vandervorst, Wilfried (2010) -
Experimental studies of dose retention and activation in FinFet-based structures
Mody, Jay; Duffy, Ray; Eyben, Pierre; Goossens, Jozefien; Moussa, Alain; Polspoel, Wouter; Berghmans, Bart; Van Dal, Mark; Pawlak, Bartek; Kaiser, Monja; Weemaes, Robbert; Vandervorst, Wilfried (2009) -
High depth resolution analysis of Si/SiGe multilayers with the atom probe
Koelling, Sebastian; Gilbert, Matthieu; Goossens, Jozefien; Hikavyy, Andriy; Richard, Olivier; Vandervorst, Wilfried (2009) -
High precision micro-scale Hall effect characterization method using in-line micro four-point probes
Petersen, Dirch; Hansen, Ole; Lin, Rong; Nielsen, P.F.; Clarysse, Trudo; Goossens, Jozefien; Rosseel, Erik; Vandervorst, Wilfried (2008) -
High precision micro-scale Hall effect characterization method using in-line micro four-point probes
Petersen, Dirch; Hansen, Olaf; Clarysse, Trudo; Goossens, Jozefien; Rosseel, Erik; Vandervorst, Wilfried; Lin, Rong; Nielsen, Peter (2008) -
Impact of multiple sub-melt laser scans on the activation and diffusion of shallow Boron junctions
Rosseel, Erik; Vandervorst, Wilfried; Clarysse, Trudo; Goossens, Jozefien; Moussa, Alain; Lin, Rong; Petersen, Dirch; Nielsen, Peter; Hansen, Otto; Bennett, Nick; Cowern, Nick (2008) -
Metrology for implanted Si substrate and dopant loss studies
Radisic, Dunja; Shamiryan, Denis; Mannaert, Geert; Boullart, Werner; Rosseel, Erik; Bogdanowicz, Janusz; Goossens, Jozefien; Marrant, Koen; Bender, Hugo; Sonnemans, Roger; Berry, Ivan (2009) -
Metrology for implanted Si substrate and dopant loss studies
Radisic, Dunja; Shamiryan, Denis; Mannaert, Geert; Boullart, Werner; Rosseel, Erik; Bogdanowicz, Janusz; Goossens, Jozefien; Marrant, Koen; Bender, Hugo (2009) -
Metrology for implanted Si substrate loss studies
Radisic, Dunja; Shamiryan, Denis; Mannaert, Geert; Boullart, Werner; Rosseel, Erik; Bogdanowicz, Janusz; Goossens, Jozefien; Marrant, Koen; Bender, Hugo; Sonnemans, Roger; Berry, Ivan (2010) -
Micro-uniformity during laser anneal: metrology and physics
Vandervorst, Wilfried; Rosseel, Erik; Lin, R.; Petersen, D.H.; Clarysse, Trudo; Goossens, Jozefien; Nielsen, P.F.; Churton, K. (2008) -
On the activation mechanisms of sub-melt laser anneals
Clarysse, Trudo; Bogdanowicz, Janusz; Goossens, Jozefien; Moussa, Alain; Rosseel, Erik; Vandervorst, Wilfried; Petersen, D.H.; Lin, R.; Nielsen, P.F.; Hansen, O.; Defranoux, C.; Vertikov, A.; Gostein, M.; Bennett, N.S.; Cowern, N.E.B.; Faifer, V.N. (2008) -
On the analysis of the activation mechanisms of sub-melt laser anneals
Clarysse, Trudo; Bogdanowicz, Janusz; Goossens, Jozefien; Moussa, Alain; Rosseel, Erik; Vandervorst, Wilfried; Petersen, Dirch; Lin, Rong; Nielsen, P.F.; Hansen, Ole; Merklin, G.; Bennett, N.S.; Cowern, N.E.B. (2008)