Browsing by author "Rodríguez, Rosana"
Now showing items 1-7 of 7
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A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
Amat, Esteve; Kauerauf, Thomas; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Degraeve, Robin; Groeseneken, Guido (2013) -
Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2010) -
Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; De Keersgieter, An; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2009) -
Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2009) -
Gate voltage influence on the channel hot-carrier degradation of high-k-based devices
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Groeseneken, Guido (2011) -
New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices
Amat, Esteve; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Kauerauf, Thomas; Degraeve, Robin; Groeseneken, Guido (2009) -
Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido (2010)