Browsing by author "Lavizzari, Simone"
Now showing items 1-11 of 11
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Copper oxide direct bonding of 200 mm CMOS wafers with five metal levels and TSVs: morphological and electrical characterization
Cavaco, Celso; Peng, Lan; Lavizzari, Simone; Claes, Jesse; Van Hoovels, Nele; Guerrieri, Stefano; Sabuncuoglu Tezcan, Deniz; Osman, Haris (2016) -
First demonstration of vertically stacked ferroelectric Al doped HfO2 devices for NAND applications
Florent, Karine; Lavizzari, Simone; Di Piazza, Luca; Popovici, Mihaela Ioana; Vecchio, Emma; Potoms, Goedele; Groeseneken, Guido; Van Houdt, Jan (2017) -
From planar to vertical capacitors : a first step towards ferroelectric V-FeFET integration
Florent, Karine; Lavizzari, Simone; Di Piazza, Luca; Popovici, Mihaela Ioana; Potoms, Goedele; Raymaekers, Tom; Groeseneken, Guido; Van Houdt, Jan (2017) -
Impact of top and bottom conductive lyers on electrical and material properties of ferroelectric aluminum doped HfO2
Florent, Karine; Popovici, Mihaela Ioana; Lavizzari, Simone; Di Piazza, Luca; Groeseneken, Guido; Van Houdt, Jan (2016) -
In depth analysis of 3D NAND enablers in gate stack integration and demonstration in 3D devices
Tan, Chi Lim; Lavizzari, Simone; Blomme, Pieter; Breuil, Laurent; Vecchio, Emma; Sebaai, Farid; Paraschiv, Vasile; Tao, Zheng; Schepers, Bart; Nyns, Laura; Peter, Antony; Dekkers, Harold; Ong, Patrick; Tsvetanova, Diana; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Raymaekers, Tom; Jossart, Nico; Mennella, Pasquale; Delhougne, Romain; Vadakupudhu Palayam, Senthil; Arreghini, Antonio; Van den Bosch, Geert; Furnemont, Arnaud (2017) -
Investigation of the endurance of FE-HfO2 devices by means of TDDB studies
Florent, Karine; Subirats, Alexandre; Lavizzari, Simone; Degraeve, Robin; Celano, Umberto; Kaczer, Ben; Di Piazza, Luca; Popovici, Mihaela Ioana; Groeseneken, Guido; Van Houdt, Jan (2018) -
Reliability study of ferroelectric Al:HfO2 thin films for DRAM and NAND applications
Florent, Karine; Lavizzari, Simone; Di Piazza, Luca; Popovici, Mihaela Ioana; Groeseneken, Guido; Van Houdt, Jan (2017) -
Specification of trace metal contamination for image sensors
Mertens, Paul; Lavizzari, Simone; Guerrieri, Stefano (2016) -
The flexoelectric effect in Al-doped hafnium oxide
Celano, Umberto; Popovici, Mihaela Ioana; Florent, Karine; Lavizzari, Simone; Favia, Paola; Paulussen, Kris; Bender, Hugo; Di Piazza, Luca; Van Houdt, Jan; Vandervorst, Wilfried (2018) -
Understanding ferroelectric Al:HfO2 thin films with Si-based electrodes for 3D applications
Florent, Karine; Lavizzari, Simone; Popovici, Mihaela Ioana; Di Piazza, Luca; Celano, Umberto; Groeseneken, Guido; Van Houdt, Jan (2017) -
Vertical ferroelectric HfO2 FET based on 3-D NAND architecture: towards dense low-power memory
Florent, Karine; Pesic, Milan; Subirats, Alexandre; Banerjee, Kaustuv; Lavizzari, Simone; Arreghini, Antonio; Di Piazza, Luca; Potoms, Goedele; Sebaai, Farid; McMitchell, Sean; Popovici, Mihaela Ioana; Groeseneken, Guido; Van Houdt, Jan (2018)