Browsing by author "Van Houdt, Jan"
Now showing items 181-200 of 358
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Improvement of write/erase cycling of memory cells with SiO2/HfO2 tunnel dielectric
Blomme, Pieter; Govoreanu, Bogdan; Van Houdt, Jan; De Meyer, Kristin (2003) -
Induced variability of cell-to-cell interference by line edge roughness in nand flash arrays
Poliakov, Pavel; Blomme, Pieter; Vaglio Pret, Alessandro; Miranda Corbalan, Miguel; Gronheid, Roel; Verkest, Diederik; Van Houdt, Jan; Dehaene, Wim (2012) -
Innovative schemes to improve reliability and density of horizontal and vertical channel 3D Flash
Arreghini, Antonio; Van den Bosch, Geert; Van Houdt, Jan (2013) -
Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memory
Zahid, Mohammed; Degraeve, Robin; Breuil, Laurent; Van den Bosch, Geert; Van Houdt, Jan (2013) -
Integration and electrical evaluation of Epi-Si and Epi-SiGe channels for 3D NAND memory applications
Capogreco, Elena; Degraeve, Robin; Lisoni, Judit; Luong, Vu; Arreghini, Antonio; Toledano Luque, Maria; Hikavyy, Andriy; Numata, Toshinori; De Meyer, Kristin; Van den Bosch, Geert; Van Houdt, Jan (2015) -
Integration of a composite SiO2HfO2 interpoly dielectric layer for low voltage polypoly erase in a 0.18μm HIMOSTM memory cell.
Blomme, Pieter; Haspeslagh, Luc; De Vos, Joeri; Lorenzini, Martino; Van Houdt, Jan; De Meyer, Kristin (2004) -
Integration of a multi-layer inter-gate dielectric with hybrid floating gate towards 10nm planar NAND flash
Breuil, Laurent; Blomme, Pieter; Tan, Chi Lim; Lisoni, Judit; Souriau, Laurent; Zahid, Mohammed; Richard, Olivier; Bender, Hugo; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Integration of HIMOSTM flash memory in a 90nm CMOS technology
De Vos, Joeri; Haspeslagh, Luc; Demand, Marc; Redolfi, Augusto; Baerts, Christina; Beckx, Stephan; Vleugels, Frank; Van Houdt, Jan (2005) -
Inter-gate dielectric engineering in hybrid floating gate stacks for NAND Flash
Breuil, Laurent; Lisoni, Judit; Blomme, Pieter; Kar, Gouri Sankar; Van den Bosch, Geert; Van Houdt, Jan (2012) -
Intergate dielectric engineering towards large P/E window planar NAND flash
Breuil, Laurent; Lisoni, Judit; Blomme, Pieter; Tan, Chi Lim; Van den Bosch, Geert; Van Houdt, Jan (2015) -
Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays
Van Houdt, Jan; Wellekens, Dirk; Vanhorebeek, Guido; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1995) -
Investigation of aggressively scaled HfALOx-based interpoly dielectric stacks for sub-45nm nonvolatile memory technologies
Govoreanu, Bogdan; Wellekens, Dirk; Haspeslagh, Luc; Brunco, David; De Vos, Joeri; Ruiz Aguado, Daniel; Blomme, Pieter; van der Zanden, Koen; Van Houdt, Jan (2007) -
Investigation of conduction variability in MOVPE In1-xGaxAs channels for vertical NAND memory
Capogreco, Elena; Arreghini, Antonio; Lisoni, Judit Gloria; Kunert, Bernardette; Guo, Weiming; De Meyer, Kristin; Van den Bosch, Geert; Van Houdt, Jan; Furnemont, Arnaud (2016) -
Investigation of ferroelectric HfZrO FET for steep slope applications
Alam, Md Nur Kutubul; Kaczer, Ben; Ragnarsson, Lars-Ake; Popovici, Mihaela Ioana; Horiguchi, Naoto; Heyns, Marc; Van Houdt, Jan (2018) -
Investigation of imprint in FE-HfO2 and its recovery
Higashi, Yusuke; Kaczer, Ben; Verhulst, Anne; O'Sullivan, Barry; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Di Piazza, Luca; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan (2020) -
Investigation of rare-earth aluminates as alternative trapping materials in flash memories
Cacciato, Antonio; Suhane, Amit; Richard, Olivier; Arreghini, Antonio; Adelmann, Christoph; Swerts, Johan; Rothschild, Aude; Van den Bosch, Geert; Breuil, Laurent; Bender, Hugo; Jurczak, Gosia; Debusschere, Ingrid; Kittl, Jorge; Van Houdt, Jan (2010) -
Investigation of the endurance of FE-HfO2 devices by means of TDDB studies
Florent, Karine; Subirats, Alexandre; Lavizzari, Simone; Degraeve, Robin; Celano, Umberto; Kaczer, Ben; Di Piazza, Luca; Popovici, Mihaela Ioana; Groeseneken, Guido; Van Houdt, Jan (2018) -
Investigation of the soft-write mechanism in source-side injection flash EEPROM devices
Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1995) -
Investigation of window instability in program/erase cycling of TANOS NAND Flash memory
Van den Bosch, Geert; Breuil, Laurent; Cacciato, Antonio; Rothschild, Aude; Jurczak, Gosia; Van Houdt, Jan (2009-05) -
Investigation on the temperature dependence of the dielectric constant of high-k materials for non-volatile memory applications
Arreghini, Antonio; Suhane, Amit; Van den Bosch, Geert; Breuil, Laurent; De Meyer, Kristin; Jurczak, Gosia; Van Houdt, Jan (2010)