Browsing by author "Hiblot, Gaspard"
Now showing items 1-20 of 39
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Antenna effect in 65nm NMOS devices with 9.5nm thick HfOx gate dielectric
Hiblot, Gaspard; O'Sullivan, Barry; Ronchi, Nicolo; Banerjee, Kaustuv (2021) -
Backside power delivery with a direct 14:1/19:1 high-ratio point-of-load power converter for servers and datacenters
Lin, Hesheng; Hiblot, Gaspard; Sun, Xiao; Talmelli, Giacomo; Velenis, Dimitrios; Bex, Pieter; Adelmann, Christoph; Lauwereins, Rudy; Catthoor, Francky; Van der Plas, Geert; Beyne, Eric (2021) -
CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark
Liu, Hsiao-Hsuan; Schuddinck, Pieter; Pei, Zhenlin; Verschueren, Lynn; Mertens, Hans; Salahuddin, Shairfe Muhammad; Hiblot, Gaspard; Xiang, Yang; Chan, Boon Teik; Subramanian, Sujith; Weckx, Pieter; Hellings, Geert; Garcia Bardon, Marie; Ryckaert, Julien; Pan, Chenyun; Catthoor, Francky (2023) -
Characterization of Impact of Vertical Stress on FinFETs
Furuhashi, Takahisa; Haneda, Masaki; Sasaki, Toru; Kagawa, Yoshihisa; Ooka, Yutaka; Hirano, Tomoyuki; Ohno, Keiichi; Iwamoto, Hayato; Saito, Masaki; Liu, Yefan; Hiblot, Gaspard; Vanstreels, Kris; Gonzalez, Mario; Velenis, Dimitrios; Beyer, Gerald; Van der Plas, Geert; De Wolf, Ingrid; Beyne, Eric (2019) -
Comparative analysis of the degradation mechanisms in logic and I/O FinFET devices induced by plasma damage
Hiblot, Gaspard; Liu, Yefan; Hellings, Geert; Van der Plas, Geert (2019) -
Cumulated charging mechanisms at gate processing in high-kappa first planar NMOS devices
Hiblot, Gaspard; Parihar, Narendra; Dupuy, Emmanuel; Mannaert, Geert; Baudot, Sylvain; Kaczer, Ben; De Heyn, Vincent; Mercha, Abdelkarim (2020) -
Design and Optimization of SRAM Macro and Logic Using Backside Interconnects at 2nm node
Chen, Rongmei; Sisto, Giuliano; Jourdain, Anne; Hiblot, Gaspard; Stucchi, Michele; Kakarla, Naveen; Chehab, Bilal; Salahuddin, Shairfe Muhammad; Schleicher, Filip; Veloso, Anabela; Hellings, Geert; Weckx, Pieter; Milojevic, Dragomir; Van der Plas, Geert; Ryckaert, Julien; Beyne, Eric (2021) -
DIBL-compensated extraction of the channel length modulation coefficient in MOSFETs
Hiblot, Gaspard (2018) -
Electrical characterization of BEOL plasma-induced damage in bulk FinFET technology
Hiblot, Gaspard; Subirats, Alexandre; Liu, Yefan; Van der Plas, Geert (2019) -
Enabling Logic with Backside Connectivity via n-TSVs and its Potential as a Scaling Booster
Veloso, Anabela; Jourdain, Anne; Hiblot, Gaspard; Schleicher, Filip; D'have, Koen; Sebaai, Farid; Radisic, Dunja; Loo, Roger; Hopf, Toby; De Keersgieter, An; Arimura, Hiroaki; Eneman, Geert; Favia, Paola; Geypen, Jef; Arutchelvan, Goutham; Vaisman Chasin, Adrian; Jang, Doyoung; Nyns, Laura; Rosseel, Erik; Hikavyy, Andriy; Mannaert, Geert; Chan, BT; Devriendt, Katia; Demuynck, Steven; Van der Plas, Geert; Ryckaert, Julien; Beyer, Gerald; Dentoni Litta, Eugenio; Beyne, Eric; Horiguchi, Naoto (2021) -
Factor analysis of plasma-induced damage in bulk FinFET technology
Hiblot, Gaspard; Van der Plas, Geert (2018) -
FinFET EOT extraction from accumulation capacitance measurements
Hiblot, Gaspard (2018) -
Full loop equivalent circuit model for plasma induced damage simulation
Hiblot, Gaspard; Van der Plas, Geert (2018) -
Impact of 1 $lm TSV via-last integration on electrical performance of advanced FinFET devices
Hiblot, Gaspard; Van Huylenbroeck, Stefaan; Van der Plas, Geert; De Wachter, Bart; Vaisman Chasin, Adrian; Kaczer, Ben; Chiarella, Thomas; Mitard, Jerome; Demuynck, Steven; Beyer, Gerald; Beyne, Eric (2018) -
Impact of packaging stress on thinned 6T SRAM die
Hiblot, Gaspard; Liu, Yefan; Van der Plas, Geert (2020) -
Impact of Sub-mu m Wafer Thinning on Latch-up Risk in STCO Scaling Era
Serbulova, Kateryna; Chen, Shih-Hung; Hellings, Geert; Hiblot, Gaspard; Veloso, Anabela; Jourdain, Anne; De Boeck, Jo; Groeseneken, Guido; Horiguchi, Naoto (2021) -
Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs
Li, Kan; Zhang, Enxia; Gorchichko, Mariia; Wang, Pengfei; Hiblot, Gaspard; Jourdain, Anne; Van Huylenbroeck, Stefaan; Reed, Robert; Fleetwood, Daniel; Schrimpf, Ronald (2020) -
Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
Li, Kan; Zhang, En Xia; Gorchichko, Mariia; Wang, Peng Fei; Reaz, Mahmud; Zhao, Simeng E.; Hiblot, Gaspard; Van Huylenbroeck, Stefaan; Jourdain, Anne; Alles, Michael L.; Reed, Robert A.; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2021) -
In-situ investigation of the impact of externally applied vertical stress on III-V bipolar transistor
Liu, Yefan; Hiblot, Gaspard; Gonzalez, Mario; Vanstreels, Kris; Velenis, Dimitrios; Badaroglu, Mustafa; Van der Plas, Geert; De Wolf, Ingrid (2018)