Browsing by author "Hiblot, Gaspard"
Now showing items 21-39 of 39
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Increasing Functionality of Wafer's Backside: Analysis of Si and WS2 Backside Power-Switch
Mirabelli, Gioele; Chen, Rongmei; Ahmed, Zubair; Chehab, Bilal; Zografos, Odysseas; Hiblot, Gaspard; Weckx, Pieter; Hellings, Geert; Ryckaert, Julien (2023) -
Investigation of mechanical stress impact on microelectronic devices using a nano-indentation probing system
Liu, Yefan; Hiblot, Gaspard; Gonzalez, Mario; De Wolf, Ingrid (2018) -
Investigation of the Impact of Externally Applied Out-of-Plane Stress on Ferroelectric FET
Liu, Yefan; Clima, Sergiu; Hiblot, Gaspard; Matagne, Philippe; Popovici, Mihaela Ioana; Kaczer, Ben; Velenis, Dimitrios; De Wolf, Ingrid (2021) -
Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
Li, Kan; Luo, Xuyi; Rony, M. W.; Gorchichko, Mariia; Hiblot, Gaspard; Van Huylenbroeck, Stefaan; Jourdain, Anne; Alles, Michael L.; Reed, Robert A.; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2023) -
New charge pumping current model assuming exponential tails in the trap energy distribution
Hiblot, Gaspard (2018) -
NPN Si/SiGe memory selector with non-linearity>10<SUP>5</SUP> and ON-current>6MA/cm<SUP>2</SUP>
Hiblot, Gaspard; Ravsher, Taras; Loo, Roger; Yengula Venkata Ramana, Bhuvaneshwari; Franchina Vergel, Nathali; Fantini, Andrea; Houshmand Sharifi, Shamin; Bazzazian, Nina; Wostyn, Kurt; Labbate, Loris Angelo; Couet, Sebastien; Kar, Gouri Sankar (2023) -
NPN SiGe Hetero Junction Transistor Latch-Up Memory Selector
Hiblot, Gaspard; Ravsher, Taras; Loo, Roger; Yengula Venkata Ramana, Bhuvaneshwari; Canvel, Yann; Franchina Vergel, Nathali; Fantini, Andrea; Houshmand Sharifi, Shamin; Bazzazian, Nina; Ayyad, Mustafa; Merkulov, Alex; Kar, Gouri Sankar; Couet, Sebastien (2023-02-03) -
Observation of plasma-induced damage in bulk germanium p-type FinFET devices and curing in high-pressure anneal
Hiblot, Gaspard; Arimura, Hiroaki; Witters, Liesbeth; Chiu, Eddie; Liu, Yefan; Mitard, Jerome; Horiguchi, Naoto; Collaert, Nadine; Van der Plas, Geert (2019) -
Parametric test for next generation semiconductor technologies
De Wachter, Bart; Marinissen, Erik Jan; Fodor, Ferenc; Hiblot, Gaspard (2017) -
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Beckers, Arnout; Michl, Jakob; Grill, Alexander; Kaczer, Ben; Garcia Bardon, Marie; Parvais, Bertrand; Govoreanu, Bogdan; De Greve, Kristiaan; Hiblot, Gaspard; Hellings, Geert (2023) -
Plasma Charging Damage in HK-First and HK-Last RMG NMOS Devices
Hiblot, Gaspard; Parihar, Narendra; Dupuy, Emmanuel; Mannaert, Geert; Baudot, Sylvain; Kaczer, Ben; Franco, Jacopo; Vandooren, Anne; De Heyn, Vincent; Mercha, Abdelkarim (2021) -
Power, Performance, Area and Thermal Analysis of 2D and 3D ICs at A14 Node Designed with Back-side Power Delivery Network
Chen, Rongmei; Lofrano, Melina; Mirabelli, Gioele; Sisto, Giuliano; Yang, Simei; Jourdain, Anne; Schleicher, Filip; Veloso, Anabela; Zografos, Odysseas; Weckx, Pieter; Hiblot, Gaspard; Van der Plas, Geert; Hellings, Geert; Ryckaert, Julien; Beyne, Eric (2022) -
Process-induced charging damage in IGZO nTFTs
Hiblot, Gaspard; Rassoul, Nouredine; Teugels, Lieve; Devriendt, Katia; Vaisman Chasin, Adrian; van Setten, Michiel; Belmonte, Attilio; Delhougne, Romain; Kar, Gouri Sankar (2021) -
Scaled FinFETs Connected by Using Both Wafer Sides for Routing via Buried Power Rails
Veloso, Anabela; Jourdain, Anne; Radisic, Dunja; Chen, Rongmei; Arutchelvan, Goutham; O'Sullivan, Barry; Arimura, Hiroaki; Stucchi, Michele; De Keersgieter, An; Hosseini, Maryam; Hopf, Toby; D'have, Koen; Wang, Shouhua; Dupuy, Emmanuel; Mannaert, Geert; Vandersmissen, Kevin; Iacovo, Serena; Marien, Philippe; Choudhury, Subhobroto; Schleicher, Filip; Sebaai, Farid; Oniki, Yusuke; Zhou, X.; Gupta, Anshul; Schram, Tom; Briggs, Basoene; Lorant, Christophe; Rosseel, Erik; Hikavyy, Andriy; Loo, Roger; Geypen, Jef; Batuk, Dmitry; Martinez Alanis, Gerardo Tadeo; Soulie, Jean-Philippe; Devriendt, Katia; Chan, BT; Demuynck, Steven; Hiblot, Gaspard; Van der Plas, Geert; Ryckaert, Julien; Beyer, Gerald; Dentoni Litta, Eugenio; Beyne, Eric; Horiguchi, Naoto (2022) -
Silicon-contacted waveguide integrated Ge/Si avalanche photodiode with 32 GHz bandwidth and multiplication gain >8
Srinivasan, Ashwyn; De Heyn, Peter; Hiblot, Gaspard; Chen, Hongtao; Pantouvaki, Marianna; Van Campenhout, Joris; Lardenois, Sebastien (2019) -
Study of out-of-plane mechanical stress impact on Si BJT and diffusion resistor using in-situ nanoindentation probing
Liu, Yefan; Hiblot, Gaspard; Furuhashi, Takahisa; Lin, Hesheng; Velenis, Dimitrios; De Wolf, Ingrid (2019) -
Study of the mechanical stress impact on silicide contact resistance by 4-point bending
Liu, Yefan; Yu, Hao; Hiblot, Gaspard; Kruv, Anastasiia; Schaekers, Marc; Horiguchi, Naoto; Velenis, Dimitrios; De Wolf, Ingrid (2019) -
TCAD study of latch-up sensitivity to wafer thinning below 500 nm
Hiblot, Gaspard; Serbulova, Kateryna; Hellings, Geert; Chen, Shih-Hung (2021) -
Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs)
Mishra, Subrat; Sankatali, Venkateswarlu; Vermeersch, Bjorn; Brunion, Moritz; Lofrano, Melina; Abdi, Dawit; Oprins, Herman; Biswas, Dwaipayan; Zografos, Odysseas; Hiblot, Gaspard; Van der Plas, Geert; Weckx, Pieter; Hellings, Geert; Myers, James; Catthoor, Francky; Ryckaert, Julien (2023)