Browsing by author "Hayama, Kiyoteru"
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Assessment of radiation induced lattice damage in shallow trench isolation diodes irradiated by neutrons
Kobayashi, K.; Ohyama, Hidenori; Hayama, Kiyoteru; Takami, Y.; Simoen, Eddy; Poyai, Amporn; Claeys, C. (2000) -
Defect assessment of irradiated STI diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2001) -
Defect assessment of irradiated STI Diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2002) -
Degradation and recovery of In0.53Ga0.47As photodiodes by 1-MeV fast neutrons
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudou, T.; Hakata, T.; Kohiki, S.; Sunaga, H. (1996) -
Degradation and recovery of proton irradiated Si1-xGe x epitaxial devices
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.; Poortmans, Jef; Caymax, Matty (1996) -
Degradation and recovery of Si1-xGex devices after proton irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.; Poortmans, Jef; Caymax, Matty (1996) -
Degradation and recovery of Si1-xGex devices by irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudo, T.; Hakata, T.; Kobayashi, K.; Sunaga, H.; Hironaka, I.; Poortmans, Jef; Caymax, Matty (1995) -
Degradation of InGaAs pin photodiodes by neutron irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudou, T.; Kohiki, S.; Sunaga, H.; Hakata, T. (1996) -
Degradation of Si1-xGex epitaxial heterojunction bipolar transistors by 1-MeV fast neutrons
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1995) -
Degradation of Si1-xGex epitxial devices by proton irradiation
Ohyama, Hidenori; Hayama, Kiyoteru; Vanhellemont, Jan; Poortmans, Jef; Caymax, Matty; Takami, Y.; Sunaga, H.; Nashiyama, I.; Uwatoko, Y. (1996) -
Degradation of SiGe devices by proton irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Nahsiyama, I.; Owatoko, Y.; Poortmans, Jef; Caymax, Matty (1997) -
Effect of radiation source on the degradation in irradiated Si1-xGex epitaxial devices
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1996) -
Electron-irradiation effects of CMOS integrated circuits with leakage current compensation
Hayama, Kiyoteru; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takizawa, H. (2000) -
High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori; Takizawa, H.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Mohammadzadeh, A. (2000) -
Impact of high energy particle irradiation on the electrical performance of Si1-xGex epitaxial diodes
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Hayama, Kiyoteru; Hakata, T.; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1998) -
Impact of high energy particle irradiation on the electrical performance of Si1-xGex epitaxial diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Hakata, T.; Simoen, Eddy; Claeys, Cor; Poortmans, Jef; Caymax, Matty; Takami, Y.; Sunaga, H. (1999) -
Impact of radiation-induced back-channel leakage and back-gate bias on drain current transients of thin-gate-oxide partially depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistors
Rafi, Joan Marc; Mercha, Abdelkarim; Simoen, Eddy; Hayama, Kiyoteru; Claeys, Cor (2004) -
Impact of the Ge content on the radiation hardness of hetero-junction diodes in SiGe strained layers
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Hayama, Kiyoteru; Hakata, T.; Tokuyama, J.; Kobayashi, K.; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1998) -
Influence of irradiation temperature on electron-irradiated STI Si diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Takakura, K.; Miura, T.; Jono, T.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2002) -
Influence of the substrate on the degradation of irradiated Si diodes
Ohyama, Hidenori; Vanhellemont, Jan; Simoen, Eddy; Claeys, Cor; Takami, Y.; Hayama, Kiyoteru; Hakata, T.; Sunaga, H.; Kobayashi, K. (1996)