Browsing by author "Janssens, Koenraad"
Now showing items 1-13 of 13
-
Assessment of quantitative characterization of localized strain using electron diffraction contrast imaging
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman (1997) -
Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995) -
Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure
Janssens, Koenraad; Vanhellemont, Jan; Maes, Herman; Van Der Biest, O.; Hull, R. (1995) -
Electron microscopy techniques for the assessment of localised stress distributions in semiconductors
Vanhellemont, Jan; Janssens, Koenraad; Frabboni, S.; Balboni, R.; Armigliato, A. (1995) -
Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R.; Bean, J. C. (1995) -
Localised Strain Characterization in Semiconductor Structures using Electron Diffraction Contrast Imaging
Janssens, Koenraad; Van der Biest, O.; Vanhellemont, Jan; Maes, Herman (1994) -
Localized strain characterization using electron diffraction contrast imaging
Janssens, Koenraad (1996) -
Nanoscale strain characterization using transmission electron microscopy: The software package SIMCON
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman (1994) -
On the characterization of the strain field of lattice defects in silicon with nanometer resolution
Janssens, Koenraad; Van der Biest, O.; Vanhellemont, Jan; Maes, Herman (1994) -
On the TEM assessment of local strain distributions in integrated circuit structures
Vanhellemont, Jan; Armigliato, A.; Frabboni, S.; Balboni, R.; Janssens, Koenraad (1994) -
Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995) -
Transmission electron diffraction techniques for nm scale strain measurement in semiconductors
Vanhellemont, Jan; Janssens, Koenraad; Frabboni, S.; Smeys, Peter; Balboni, R.; Armigliato, A. (1996) -
Transmission electron diffraction techniques for nm scale strain measurements in semiconductors
Vanhellemont, Jan; Janssens, Koenraad; Frabboni, S.; Smeys, Peter; Balboni, R.; Armigliato, A. (1996)