Browsing by author "Magnone, P."
Now showing items 1-11 of 11
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1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Magnone, P.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Pantisano, Luigi; Maji, D.; Rao, V.R.; Srinivasan, P. (2009) -
A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Crupi, F.; Giusi, G.; Iannacone, G.; Magnone, P.; Pace, C.; Simoen, Eddy; Claeys, Cor (2009) -
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Maji, D.; Crupi, F.; Magnone, P.; Giusi, G.; Pace, C.; Simoen, Eddy; Rao, V.Ramgopal (2009) -
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks
Srinivasan, Purushothaman; Crupi, F.; Simoen, Eddy; Magnone, P.; Pace, C.; Misra, D.; Claeys, Cor (2007) -
Modeling the gate current 1/f noise and its application to advanced CMOS devices
Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
Tallarico, Andrea N.; Stoffels, Steve; Magnone, P.; Hu, Jie; Lenci, Silvia; Marcon, Denis; Sangiorgi, E.; Fiegna, C.; Decoutere, Stefaan (2016) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Mercha, Abdelkarim; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Maji, D.; Crupi, Felice; Amat, E.; Simoen, Eddy; De Jaeger, Brice; Brunco, David; Manoj, C.R.; Ramgopal Rao, V.; Magnone, P.; Giusi, G.; Pace, C.; Pantisano, Luigi; Mitard, Jerome; Rodríguez, R.; Nafría, M. (2009) -
Understanding the potential and the limits of germanium pMOSFETs for VLSI circuits from experimental measurements
Magnone, P.; Crupi, Felice; Alioto, M.; Kaczer, Ben; De Jaeger, Brice (2011)