Browsing by imec author "4f7c405e2130e203d3178660ae69b5e0824c1d83"
Now showing items 1-20 of 136
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A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Putcha, Vamsi; Bury, Erik; Simicic, Marko; Vaisman Chasin, Adrian; Linten, Dimitri; Parvais, Bertrand; Catthoor, Francky; Rzepa, Gerhard; Waltl, Michael; Grasser, Tibor (2018) -
A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Grill, Alexander; Michl, J.; Diaz Fortuny, Javier; Beckers, Arnout; Bury, Erik; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; De Greve, Kristiaan (2023) -
a-IGZO Schottky diode as selector for cross-point memory application
Vaisman Chasin, Adrian; Zhang, Leqi; Bhoolokam, Ajay; Nag, Manoj; Steudel, Soeren; Govoreanu, Bogdan; Gielen, Georges; Heremans, Paul (2014) -
Amorphous indium-gallium-zinc-oxide as electron transport layer in organic photodetectors
Arora, Himani; Malinowski, Pawel; Vaisman Chasin, Adrian; Cheyns, David; Steudel, Soeren; Schols, Sarah; Heremans, Paul (2015) -
Amorphous metal-oxide semiconductor based thin-film electronic devices for RF applications on foil
Vaisman Chasin, Adrian (2014-08) -
Amorphous-IGZO thin-film-transistors with mf-PVD SiO2 as an etch-stop-layer
Nag, Manoj; Steudel, Soeren; Bhoolokam, Ajay; Vaisman Chasin, Adrian; Myny, Kris; Mass, Joris; Fritz, Thomas; Trube, Jutta; Gelinck, Gerwin; Groeseneken, Guido; Heremans, Paul (2014) -
An integrated a-IGZO UHF energy harvester for passive RFID tags
Vaisman Chasin, Adrian; Volskiy, Vladimir; Libois, Michael; Myny, Kris; Nag, Manoj; Rockele, Maarten; Vandenbosch, Guy; Genoe, Jan; Gielen, Georges; Heremans, Paul (2014) -
Analysis of frequency dispersion in amorphous In-Ga-Zn-O thin film transistors
Bhoolokam, Ajay; Nag, Manoj; Vaisman Chasin, Adrian; Steudel, Soeren; Genoe, Jan; Gelinck, Gerwin; Groeseneken, Guido; Heremans, Paul (2015) -
Analysis of the features of hot-carrier degradation in FinFETs
Makarov, Alexander; Tyaginov, Stanislav; Kaczer, Ben; Jech, Markus; Vaisman Chasin, Adrian; Grill, Alexander; Hellings, Geert; Vexler, Mikhail; Linten, Dimitri; Grasser, Tibor (2018-10) -
Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space
Bury, Erik; Vaisman Chasin, Adrian; Chuang, Kent; Vandemaele, Michiel; Van Beek, Simon; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2019) -
Back-channel-etch amorphous indium-gallium-zinc oxide thin-film transistors: The impact of source/drain metal etch and final passivation
Nag, Manoj; Bhoolokam, Ajay; Steudel, Soeren; Myny, Kris; Maas, Joris; Vaisman Chasin, Adrian; Groeseneken, Guido; Heremans, Paul (2014) -
Back-channel-etch process flow for a-IGZO TFTs
Nag, Manoj; Steudel, Soeren; Vaisman Chasin, Adrian; Myny, Kris; Rockele, Maarten; Bhoolokam, Ajay; Willegems, Myriam; Smout, Steve; Vicca, Peter; Ameys, Marc; Schols, Sarah; Genoe, Jan; Groeseneken, Guido; Heremans, Paul (2013) -
Benchmarking time-dependent variability of junctionless nanowire FETs
Kaczer, Ben; Rzepa, G.; Franco, Jacopo; Weckx, Pieter; Vaisman Chasin, Adrian; Putcha, Vamsi; Bury, Erik; Simicic, Marko; Roussel, Philippe; Hellings, Geert; Veloso, Anabela; Matagne, Philippe; Grasser, T.; Linten, Dimitri (2017) -
Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach
Makarov, Alexander; Kaczer, Ben; Vaisman Chasin, Adrian; Vandemaele, Michiel; Grill, Alexander; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery
Bastos, Joao; O'Sullivan, Barry; Franco, Jacopo; Tyaginov, Stanislav; Truijen, Brecht; Vaisman Chasin, Adrian; Degraeve, Robin; Kaczer, Ben; Ritzenthaler, Romain; Capogreco, Elena; Dentoni Litta, Eugenio; Spessot, Alessio; Higashi, Yusuke; Yoon, Younggwang; Machkaoutsan, Vladimir; Fazan, Pierre; Horiguchi, Naoto (2022) -
Bidirectional communication in an HF hybrid organic/solution-processed metal-oxide RFID tag
Myny, Kris; Rockele, Maarten; Vaisman Chasin, Adrian; Pham, Duy-Vu; Steiger, Jürgen; Botnaras, Silviu; Weber, Dennis; Herold, Bernhard; Ficker, Jürgen; van der Putten, Bas; Gelinck, Gerwin H.; Genoe, Jan; Dehaene, Wim; Heremans, Paul (2012) -
Bidirectional communication in an HF hybrid organic/solution-processed metal-oxide RFID tag
Myny, Kris; Rockele, Maarten; Vaisman Chasin, Adrian; Pham, Duy-Vu; Steiger, Jürgen; Botnaras, Silviu; Weber, Dennis; Herold, Bernhard; Ficker, Jürgen; van der Putten, Bas; Gelinck, Gerwin; Genoe, Jan; Dehaene, Wim; Heremans, Paul (2014) -
Bidirectional RFID tags on foil based on hybrid organic-oxide complementary thin-film technology
Rockele, Maarten; Vaisman Chasin, Adrian; Steudel, Soeren; Myny, Kris; Nag, Manoj; Ke, Tung Huei; Schols, Sarah; Genoe, Jan; Aernouts, Tom; Heremans, Paul; Turkenburg, Daniel; van der Putten, Bas; Gelinck, Gerwin; Pham, Duy-Vu; Steiger, Juergen; Botnaras, Silviu; Weber, Dennis; Herold, Bernhard; Ficker, Juergen (2012) -
Bidirectional RFID tags on foil based on hybrid organic-oxide complementary thin-film technology
Rockele, Maarten; Vaisman Chasin, Adrian; Steudel, Soeren; Myny, Kris; Nag, Manoj; Ke, Tung Huei; Schols, Sarah; Genoe, Jan; Aernouts, Tom; Heremans, Paul; Turkenburg, Daniel; van der Putten, Bas; Gelinck, Gerwin; Pham, Duy-Vu; Steiger, Juergen; Botnaras, Silviu; Weber, Dennis; Herold, Bernhard; Ficker, Juergen (2012) -
BTI reliability and time-dependent variability of stacked gate-all-around Si nanowire transistors
Vaisman Chasin, Adrian; Franco, Jacopo; Kaczer, Ben; Putcha, Vamsi; Weckx, Pieter; Ritzenthaler, Romain; Mertens, Hans; Horiguchi, Naoto; Linten, Dimitri; Rzepa, Gerhard (2017)