Browsing by author "Delmotte, Joris"
Now showing items 1-17 of 17
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Advances in metrology for complex epitaxial systems embedded in small volums
Vandervorst, Wilfried; Kumar, Arul; Meersschaut, Johan; Franquet, Alexis; Douhard, Bastien; Delmotte, Joris; Conard, Thierry; Nuytten, Thomas; Hantschel, Thomas; Loo, Roger (2015-05) -
Cesium/xenon dual beam sputtering in a Cameca instrument
Pureti, Rathaiah; Douhard, Bastien; Delmotte, Joris; Merkulov, Alexandre; Vandervorst, Wilfried (2014) -
Composition measurements of thin films beyond the spatial resolution of SIMS
Franquet, Alexis; Douhard, Bastien; Delmotte, Joris; Merckling, Clement; Conard, Thierry; Vandervorst, Wilfried (2013) -
Compressively strained SiGe band-to-band tunneling model calibration based on p-i-n diodes and prospects of strained SiGe tunneling field-effect transistors
Kao, Frank; Verhulst, Anne; Rooyackers, Rita; Douhard, Bastien; Delmotte, Joris; Bender, Hugo; Richard, Olivier; Vandervorst, Wilfried; Simoen, Eddy; Hikavyy, Andriy; Loo, Roger; Arstila, Kai; Collaert, Nadine; Thean, Aaron; Heyns, Marc; De Meyer, Kristin (2014) -
Depth resolution and surface transients in crystalline Silicon at ultra low energies
Goossens, Jozefien; Berghmans, Bart; Franquet, Alexis; Nguyen, Duy; Delmotte, Joris; Geenen, Luc; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2009-09) -
Direct physical evidence of mechanisms of leakage and equivalent oxide thickness reduction in metal-insulator-metal capacitors based on RuOx/TiOx/SrxTiyOz/TiN stacks
Pawlak, Malgorzata; Swerts, Johan; Popovici, Mihaela Ioana; Kaczer, Ben; Kim, Min-Soo; Wang, Wan-Chih; Tomida, Kazuyuki; Govoreanu, Bogdan; Delmotte, Joris; Afanas'ev, Valeri; Schaekers, Marc; Vandervorst, Wilfried; Kittl, Jorge (2012) -
Dopant profiliing in textured structures for photovoltaic applications
Vandervorst, Wilfried; Douhard, Bastien; Delmotte, Joris (2011) -
GeSn channel nMOSFETs: material potential and technological outlook
Gupta, Somya; Vincent, Benjamin; Lin, Dennis; Gunji, M.; Firrincieli, Andrea; Gencarelli, Federica; Magyari-Kope, B.; Yang, B.; Douhard, Bastien; Delmotte, Joris; Franquet, Alexis; Caymax, Matty; Dekoster, Johan; Nishi, Y.; Saraswat, K.C. (2012) -
MBE growth investigations of InxGa1-xAs/GaAsySb1-y systems for TFET performance prediction
El Kazzi, Salim; Smets, Quentin; Rooyackers, Rita; Delmotte, Joris; Geypen, Jef; Verhulst, Anne; Collaert, Nadine; Heyns, Marc; Merckling, Clement; Thean, Aaron (2015) -
Probing ultra thin Si passivation layers on Ge-substrates
Vandervorst, Wilfried; Douhard, Bastien; Delmotte, Joris; Franquet, Alexis; Vincent, Benjamin; Caymax, Matty (2011) -
Quantification of group IV alloys in confined structures: the self focusing SIMS approach
Franquet, Alexis; Douhard, Bastien; Melkonyan, Davit; Delmotte, Joris; Demeulemeester, Jelle; Conard, Thierry; Vandervorst, Wilfried (2014) -
Record low contact resistivity to n-type Ge for CMOS and memory applications
Martens, Koen; Firrincieli, Andrea; Rooyackers, Rita; Vincent, Benjamin; Loo, Roger; Locorotondo, Sabrina; Rosseel, Erik; Vandeweyer, Tom; Hellings, Geert; De Jaeger, Brice; Meuris, Marc; Favia, Paola; Bender, Hugo; Douhard, Bastien; Delmotte, Joris; Vandervorst, Wilfried; Simoen, Eddy; Jurczak, Gosia; Wouters, Dirk; Kittl, Jorge (2010) -
Si passivation for Ge pMOSFETs: impact of Si cap growth conditions
Vincent, Benjamin; Loo, Roger; Vandervorst, Wilfried; Delmotte, Joris; Douhard, Bastien; Valev, Ventislav; Vanbel, Maarten; Verbiest, Thierry; Rip, Jens; Brijs, Bert; Conard, Thierry; Claypool, Chris; Takeuchi, Shotaro; Zaima, Shigeaki; Mitard, Jerome; De Jaeger, Brice; Dekoster, Johan; Caymax, Matty (2011) -
Sims depth profiling with sub-nm resolution (?)
Vandervorst, Wilfried; Douhard, Bastien; Delmotte, Joris; Vincent, Benjamin (2011) -
Simulation of the anneal of ion implanted boron emitter and the impact on the saturation current density
Florakis, Antonios; Janssens, Tom; Rosseel, Erik; Douhard, Bastien; Delmotte, Joris; Cornagliotti, Emanuele; Poortmans, Jef; Vandervorst, Wilfried (2012) -
Simulation of the phosphorus profiles in a c-Si solar cell fabricated using POCl3 diffusion or ion implantation and annealing
Florakis, Antonios; Janssens, Tom; Posthuma, Niels; Delmotte, Joris; Douhard, Bastien; Poortmans, Jef; Vandervorst, Wilfried (2013) -
Simulation of the post-implantation anneal for emitter profile optimization in high efficiency c-Si solar cells
Florakis, Antonios; Vandervorst, Wilfried; Janssens, Tom; Rosseel, Erik; Douhard, Bastien; Delmotte, Joris; Cornagliotti, Emanuele; Baert, Kris; Posthuma, Niels; Poortmans, Jef (2012)