Browsing by author "Ohyama, H."
Now showing items 1-20 of 92
-
A model for the radiation degradation of polycrystalline silicon films
Ohyama, H.; Nakabayashi, M.; Takakura, K.; Simoen, Eddy; Takami, Y.; Claeys, Cor (2002) -
A study on radiation damage of IGBTs 2-MeV electrons at different temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2004) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Ohyama, H.; Claeys, Cor; Nakabayashi, H.; Masakazu, T.; Simoen, Eddy; Hanano, M.; Naotika, F.; Hirao, T. (2003) -
Anomalous threshold voltage change by 2 MeV electron irradiation at 100°C in deep submicron metal-oxide-semiconductor field-effect transistors
Hayama, K.; Ohyama, H.; Simoen, Eddy; Rafi, Joan Marc; Mercha, Abdelkarim; Claeys, Cor (2004-04) -
Body potential analysis of ultra thin gate oxide FD-SOI MOSFETs in accumulation mode operation
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2008) -
Carrier lifetime evaluation of electron irradiated SiGe/Si diode
Idemoto, T.; Ohyama, H.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Nakashima, T.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2010) -
Carrier lifetime studies in diode structures on Si substrates with and without Ge doping
Uleckas, A.; Gaubas, E.; Rafi, J.M.; Chen, J.; Yang, D.; Ohyama, H.; Simoen, Eddy; Vanhellemont, J. (2011) -
Comparison of electron irradiation effect on thermal donors in Cz and oxygen doped FZ silicon
Takakura, K.; Ohyama, H.; Yoshida, T.; Murakawa, H.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2003) -
Comparison of electron irradiation effects on diodes fabricated on silicon and on germanium doped silicon substrates
Ohyama, H.; Rafi, J.M.; Campabadal, F.; Takakura, K.; Simoen, Eddy; Chen, J.; Vanhellemont, J. (2009) -
Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes
Ohyama, H.; Takakura, K.; Hayama, K.; Kuboyama, S.; Deguchi, Y.; Matsuda, S.; Simoen, Eddy; Claeys, Cor (2003) -
Degradation and their recovery behavior of irradiated GaAlAs LEDs
Ohyama, H.; Takakura, K.; Nagano, T.; Hanada, M.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor (2008) -
Degradation behavior for high-temperature irradiated npn Si transistors
Ohyama, H.; Takakura, T.; Nishiyana, E.; Simoen, Eddy; Claeys, Cor (2002) -
Degradation behaviors for high temperature irradiated NPN Si transistors
Ohyama, H.; Takakura, K.; Nishiyama, K.; Simoen, Eddy; Claeys, Cor (2002) -
Degradation of drain current hysteresis in electron-irradiated FD-SOI MOSFETs in accumulation mode operation
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation
Hayama, K.; Takakura, K.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor; Rafi, J.M.; Kokkoris, M. (2004) -
Degradation of high resistivity silicon float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation
Rafi, J.M.; Boulord, C.; Hayama, K.; Ohyama, H.; Campabadal, F.; Pellegrini, G.; Lozano, M.; Simoen, Eddy; Claeys, Cor (2008) -
Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation
Rafi, J.M.; Boulord, C.; Hayama, K.; Ohyama, H.; Campabadal, F.; Pellegrini, G.; Lozano, M.; Simoen, Eddy; Claeys, Cor (2009) -
Degradation of SiC-MESFETs by irradiation
Ohyama, H.; Takakura, K.; Uemura, K.; Shigaki, K.; Kudou, T.; Matsumoto, T.; Arai, M.; Kuboyama, S.; Kamezawa, C.; Simoen, Eddy; Claeys, Cor (2008)