Browsing by author "Vantomme, Andre"
Now showing items 121-140 of 180
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New approaches for formation of ultra-thin PtSi layers for infrared applications
Alves Donaton, Ricardo; Jin, S.; Bender, Hugo; Zagrebnov, Maxim; Baert, Kris; Maex, Karen; Vantomme, Andre; Langouche, G. (1998) -
New technique for forming continuous, smooth and uniform ultrathin (3nm) PtSi layers
Alves Donaton, Ricardo; Jin, S.; Bender, Hugo; Conard, Thierry; De Wolf, Ingrid; Maex, Karen; Vantomme, Andre; Langouche, G. (1999) -
Nucleation and growth of TiN films deposited by atomic layer deposition
Satta, Alessandra; Brongersma, Sywert; Schuhmacher, Jörg; Conard, Thierry; Beyer, Gerald; Maex, Karen; Viitanen, M.M.; Brongersma, H.H.; Besling, W.; Kilpela, Olli; Sprey, Hessel; Vantomme, Andre (2002) -
On the nucleation of PdSi and NiSi2 during the ternary Ni(Pd)/Si(100) reaction
Schrauwen, Annelore; Demeulemeester, Jelle; Kumar, Arul; Vandervorst, Wilfried; Comrie, C; Temst, Kristiaan; Vantomme, Andre (2013) -
On the thermal expansion coefficient of CoSi2 and NiSi2
Smeets, D.; Vanhoyland, G.; D'Haen, Jan; Vantomme, Andre (2009) -
Optical spectroscopy and composition of GaN
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Jacobs, Koen; Van der Stricht, Wim; Demeester, Piet; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. W. (2000) -
Optical spectroscopy and composition of InGaN
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Jacobs, Koen; Van der Stricht, Wim; Demeester, Piet; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. (1999) -
Photoluminescence mapping and Rutherford backscattering of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen (1999) -
Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen; Martin, R. W. (1999) -
Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen (1999) -
PIXE as a complementary technique to RBS in thin film characterization
Meersschaut, Johan; Kayhko, Marko; Lenka, Hara; Zhao, Qiang; Vantomme, Andre; Vandervorst, Wilfried (2012-03) -
Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
Cuduvally, Ramya; Oosterbos, Giel; Morris, Richard; Fleischmann, Claudia; Ferrari, Piero; Scheerder, Jeroen; Vantomme, Andre; Vandervorst, Wilfried (2019) -
Potentialities and limitations of low-energy TOF-ERDA for high resolution and quantitative profiling of thin films
Giangrandi, Simone; Brijs, Bert; Arstial, K.; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Treguer, J. F.; Grimson, S. T. F.; Osborne, I.; Barisonzi, M.; Middleton, P. G.; Manson-Smith, S. K.; Mohammed, A.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Treguer, J. F.; Grimson, S. T. F.; Osborne, I.; Barisonzi, M.; Middleton, P. G.; Manson-Smith, S. K.; Mohammed, A.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; McColl, D.; Sweeney, F.; Grimson, S. T. F.; Treguer, J. F.; Mohammed, A.; Middleton, P. G.; Manson-Smith, S. K.; O'Donnell, K. P.; Van der Stricht, Wim; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre; Zubia, D.; Hersee, S. D. (2000) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, Carol; McColl, D.; Sweeney, F.; Grimson, S.T.F.; Treguer, J.-F.; Mohammed, A.; Middleton, P.G.; Manson-Smith, S.K.; O'Donnell, K.P.; Van der Stricht, Wim; Moerman, Ingrid; Demeester, Piet; Wu, M.F.; Vantomme, Andre; Zubia, D.; Hersee, S.D. (2000) -
Probing the dynamical properties of the metastable bcc FexCo1-x phase
Laenens, Bart; Planckaert, Nikie; Sternik, M.; Jochym, P.T.; Parlinski, Krzysztof; Vantomme, Andre; Meersschaut, Johan (2009) -
Properties of TiN thin films deposited by ALCVD as barriers for Cu metallization
Satta, Alessandra; Beyer, Gerald; Maex, Karen; Elers, K.; Haukka, S.; Vantomme, Andre (2000) -
Properties of TiN thin films deposited by ALCVD as barriers for Cu metallization
Satta, Alessandra; Beyer, Gerald; Maex, Karen; Elers, K.; Haukka, S.; Vantomme, Andre (2001)