Browsing by author "Yoneoka, M."
Now showing items 1-20 of 25
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20-MeV alpha ray effects in AlGaAsP p-HEMTs
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Kobayashi, K.; Yoneoka, M.; Nakabayashi, M.; Hakata, T.; Takizawa, H. (2000) -
Carrier lifetime evaluation of electron irradiated SiGe/Si diode
Idemoto, T.; Ohyama, H.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Nakashima, T.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2010) -
Degradation and recovery of 1.3μm InGaAsP laser diodes irradiated by 1-MeV fast neutrons
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Kudou, T.; Yoneoka, M.; Sunaga, H. (1999) -
Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Matsuyama, K.; Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Effect of gate interface on performance degration of irradiated SiC-MESFET
Ohyama, H.; Takakura, K.; Yoneoka, M.; Uemura, K.; Motoki, M.; Matsuo, K.; Arai, M.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor (2007) -
Effects of mechanical stress on polycrystalline-silicon resistors
Nakabayashi, M.; Ohyama, Hidenori; Simoen, Eddy; Ikegami, M.; Claeys, Cor; Kobayashi, K.; Yoneoka, M.; Miyahara, K. (2002) -
Electron irradiation of IGBTs
Nakabayashi, M.; Iwata, T.; Ohyama, H.; Takakura, K.; Yoneoka, M.; Simoen, Eddy; Claeys, Cor (2004) -
Impact of 20-MeV alpha ray irradiation on V-band performance of AlGaAs pseudomorphic HEMTs
Ohyama, Hidenori; Yajima, K.; Simoen, Eddy; Kato, T.; Claeys, Cor; Takami, Y.; Kobayashi, K.; Yoneoka, M.; Sunaga, H. (2000) -
Impact of induced lattice defects on performance degradation of AlGaAs/GaAs p-HEMTs
Hakata, T.; Ohyama, Hidenori; Kuroda, S.; Simoen, Eddy; Claeys, C.; Kudou, T.; Kobayashi, K.; Nakabayashi, M.; Yoneoka, M.; Takami, Y.; Sunaga, H.; Miyahara, K. (1999) -
Impact of neutron irradiation on optical performance of InGaAsP laser diodes
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Sunaga, H.; Yoneoka, M.; Nakabayashi, M.; Kobayashi, K.; Kudou, T. (2000) -
Influence of boron implantation dose on the mechanical stress in polycrystalline silicon films
Nakabayashi, M.; Ikegami, M.; Ohyama, Hidenori; Kobauashi, K.; Yoneoka, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Sunaga, H.; Takizawa, H. (2000) -
Influence of mechanical stress on the electrical performance of polycrystalline-silicon resistors
Nakabayashi, M.; Ohyama, Hidenori; Kobayashi, K.; Yoneoka, M.; Simoen, Eddy; Claeys, C.; Takami, Y.; Sunaga, H.; Takizawa, H. (2000) -
Investigation of the electrical properties of carbon doped Si0.75Ge0.25/Si hetero junction diodes by 2 MeV electron irradiation
Takakura, Kenichiro; Ogata, H.; Inoue, T.; Yoneoka, M.; Tsunoda, I.; Simoen, Eddy; Claeys, Cor (2015) -
Mechanical stress of the electrical performance of polycrystalline-silicon resistors
Nakabayashi, N.; Ohyama, Hidenori; Simoen, Eddy; Ikegami, M.; Claeys, Cor; Kobayashi, K.; Yoneoka, M.; Miyahara, K. (2001) -
Radiation damage of n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Kobayashi, K.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Yoneoka, M.; Hayama, Kiyoteru; Takizawa, H.; Kohiki, S. (2000) -
Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Kobayashi, K.; Ohyama, Hidenori; Yoneoka, M.; Hayama, Kiyoteru; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami., Y.; Takizawa, H.; Kohiki, S. (2001) -
Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrations
Nakashima, T.; Idemoto, T.; Tsunoda, I.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Yoshino, K.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2012) -
Radiation damages of SiGe devices by electron irradiation and their thermally recovery bahavior
Nakashima, T.; Idemoto, T.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Ohyama, H.; Yoshino, K.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Eneman, Geert; Claeys, Cor (2010) -
Radiation hardness of electrical properties of n-channel UTBOX SOI by 2 MeV electron irradiation
Takakura, Kenichiro; Goto, T.; Yoneoka, M.; Tsunoda, I.; Simoen, Eddy; Claeys, Cor (2015)