Browsing by author "Luo, Jun"
Now showing items 1-18 of 18
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A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs
Zhou, Longda; Zhang, Zhaohao; Yang, Hong; Ji, Zhigang; Liu, Qianqian; Zhang, Qingzhu; Simoen, Eddy; Yin, Huaxiang; Luo, Jun; Du, Anyan; Zhao, Chao; Wang, Wenwu (2021) -
Alleviation of Negative-Bias Temperature Instability in Si p-FinFETs With ALD W Gate-Filling Metal by Annealing Process Optimization
Zhou, Longda; Liu, Qianqian; Yang, Hong; Ji, Zhigang; Xu, Hao; Wang, Guilei; Simoen, Eddy; Jiang, Haojie; Luo, Ying; Kong, Zhenzhen; Bai, Guobin; Luo, Jun; Yin, Huaxiang; Zhao, Chao; Wang, Wenwu (2021) -
Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Chang, Hao; Zhang, Yongkui; Zhou, Longda; Ji, Zhigang; Yang, Hong; Liu, Qianqian; Li, Yongliang; Liang, Renrong; Simoen, Eddy; Zhu, Huilong; Luo, Jun; Wang, Wenwu (2021) -
Defect engineering for shallow n-type junctions in germanium: facts and fiction
Simoen, Eddy; Schaekers, Marc; Liu, Jinbiao; Luo, Jun; Zhao, Chao; Barla, Kathy; Collaert, Nadine (2016) -
Distinction between silicon and oxide traps using single-trap spectroscopy
Fang, Wen; Simoen, Eddy; Aoulaiche, Marc; Luo, Jun; Zhao, Chao; Claeys, Cor (2014) -
Impact of the effective work function gate metal on the low-frequency noise of gate-all-around Silicon-on-Insulator NWFETs
Fang, Wen; Veloso, Anabela; Simoen, Eddy; Cho, Moon Ju; Collaert, Nadine; Thean, Aaron; Luo, Jun; Zhao, Chao; Ye, T.; Claeys, Cor (2016) -
Implications of inelastic tunneling on the depth of oxide traps in MOSFETs assessed by RTS or BTI
Simoen, Eddy; Claeys, Cor; Fang, Wen; Luo, Jun; Zhao, Chao (2015) -
In-band label extractor based on cascaded Si ring resonators enabling 160Gb/s optical packet switching modules
De Heyn, Peter; Luo, Jun; Di Lucente, Stefano; Callabretta, Nicola; Dorren, Harm J.S.; Van Thourhout, Dries (2014-05) -
Low frequency noise characterization of 22nm PMOS featuring with filling W gate using different precursors
He, Liang; Simoen, Eddy; Claeys, Cor; Wang, Guilei; Luo, Jun; Zhao, Chao; Li, Junfeng; Chen, Hua; Hu, Yin; Qin, Xiaoting (2017) -
Low frequency noise characterization of GeOx passivated Germanium MOSFETs
Fang, Wen; Simoen, Eddy; Arimura, Hiroaki; Mitard, Jerome; Sioncke, Sonja; Mertens, Hans; Mocuta, Anda; Collaert, Nadine; Luo, Jun; Zhao, Chao; Thean, Aaron; Claeys, Cor (2015) -
Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
Simoen, Eddy; Cretu, Bogdan; Fang, Wen; Aoulaiche, Marc; Routoure, Jean-Marc; Carin, Regis; Luo, Jun; Zhao, Chao; Claeys, Cor (2016) -
Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack
Fang, Wen; Simoen, Eddy; Arimura, Hiroaki; Mitard, Jerome; Thean, Aaron; Luo, Jun; Zhao, Chao; Claeys, Cor (2015) -
Random telegraph noise: the key to single defect studies in nano-devices
Simoen, Eddy; Fang, Wen; Aoulaiche, Marc; Luo, Jun; Zhao, Chao; Claeys, Cor (2016) -
Study of DID/ID of a single charge trap in UTBOX silicon films
Fang, Wen; Simoen, Eddy; Aoulaiche, Marc; Luo, Jun; Zhao, Chao; Claeys, Cor (2014) -
Study of random telegraph noise in UTBOX silicon-on-insulator nMOSFETs
Li, Chi-Kang; Fang, Wen; Simoen, Eddy; Aoulaiche, Marc; Wu, Yuh-Renn; Luo, Jun; Zhao, Chao; Claeys, Cor (2014) -
The assessment of border traps in high-mobility channel materials
Simoen, Eddy; Alian, AliReza; Arimura, Hiroaki; Lin, Dennis; Mertens, Hans; Mitard, Jerome; Sioncke, Sonja; Fang, Wen; Luo, Jun; Zhao, Chao; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2015) -
Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
Simoen, Eddy; Cretu, Bogdan; Fang, Wen; Aoulaiche, Marc; Routoure, Jean-Marc; Carin, Regis; Dos Santos, Sara; Luo, Jun; Zhao, Chao; Martino, Joao; Claeys, Cor (2014) -
Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs
Simoen, Eddy; Cretu, Bogdan; Fang, Wen; Aoulaiche, Marc; Routoure, Jean-Marc; Carin, Regis; dos Santos, Sara; Luo, Jun; Zhao, Chao; Martino, Joao Martino; Claeys, Cor (2015)