Browsing by author "Nielsen, Peter"
Now showing items 1-10 of 10
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Electrical characterization of single nanometer-wide Si fins in dense arrays
Folkersma, Steven; Bogdanowicz, Janusz; Schulze, Andreas; Favia, Paola; Dirch, Petersen; Ole, Hansen; Henrik, Henrichsen; Nielsen, Peter; Shiv, Lior; Vandervorst, Wilfried (2018) -
Fast micro Hall effect measurements on small pads
Ĝsterberg, Frederik Westergaard; Petersen, Dirch; Nielsen, Peter; Rosseel, Erik; Vandervorst, Wilfried; Hansen, Ole (2011) -
High precision micro-scale Hall effect characterization method using in-line micro four-point probes
Petersen, Dirch; Hansen, Olaf; Clarysse, Trudo; Goossens, Jozefien; Rosseel, Erik; Vandervorst, Wilfried; Lin, Rong; Nielsen, Peter (2008) -
Impact of multiple sub-melt laser scans on the activation and diffusion of shallow Boron junctions
Rosseel, Erik; Vandervorst, Wilfried; Clarysse, Trudo; Goossens, Jozefien; Moussa, Alain; Lin, Rong; Petersen, Dirch; Nielsen, Peter; Hansen, Otto; Bennett, Nick; Cowern, Nick (2008) -
In-line sheet resistance measurements of nanometer-wide semiconducting fins
Bogdanowicz, Janusz; Folkersma, Steven; Schulze, Andreas; Moussa, Alain; Merckling, Clement; Kunert, Bernardette; Guo, Weiming; Petersen, Dirch; Witthoft, Maria-Louise; Hansen, Ole; Henrichsen, Henrik; Nielsen, Peter; Vandervorst, Wilfried (2017) -
Micro probe carrier profiling of ultra-shallow structures in germanium
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Eyben, Pierre; Douhard, Bastien; Vandervorst, Wilfried; Nielsen, Peter; Lin, Rong; Petersen, Dirch; Wang, Fei; Hansen, Ole (2010) -
Photo-voltage versus micro-probe sheet resistance measurements on ultra-shallow structures
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Bogdanowicz, Janusz; Cornagliotti, Emanuele; Vandervorst, Wilfried; Bender, Hugo; Pfeffer, Markus; Schellenberger, Martin; Nielsen, Peter; Thorsteinsson, Sune; Lin, Rong; Petersen, Dirch (2009) -
Photovoltage versus microprobe sheet resistance measurements on ultrashallow structures
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Bogdanowicz, Janusz; Vandervorst, Wilfried; Bender, Hugo; Pfeffer, Markus; Schellenberger, Martin; Nielsen, Peter; Thorsteinsson, Sune; Lin, Rong; Petersen, Dirch (2010) -
Width-dependent sheet resistance of nanometer-wide Si fins as measured with micro four-point probe
Bogdanowicz, Janusz; Folkersma, Steven; Sergeant, Stefanie; Schulze, Andreas; Moussa, Alain; Petersen, Dirch; Hansen, Ole; Henrichsen, Henrik; Nielsen, Peter; Vandervorst, Wilfried (2018) -
Zero and one-dimensional electrical characterization of nanometer-wide Si fins
Folkersma, Steven; Bogdanowicz, Janusz; Schulze, Andreas; Favia, Paola; Franquet, Alexis; Spampinato, Valentina; Petersen, Dirch; Hansen, Ole; Henrichsen, Henrik; Nielsen, Peter; Shiv, Lior; Vandervorst, Wilfried (2018)