Browsing by author "Paredis, Kristof"

3D imaging of atom probe tip shapes with atomic force microscopy

Fleischmann, Claudia; Paredis, Kristof; Melkonyan, Davit; Op de Beeck, Jonathan; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2018)

3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors

Eyben, Pierre; Ritzenthaler, Romain; De Keersgieter, An; Chiarella, Thomas; Veloso, Anabela; Mertens, Hans; Pena, Vanessa; Santoro, Gaetano; Machillot, Jerome; Kim, Myungsun; Miyashita, Toshihiko; Yoshida, Naomi; Bender, Hugo; Richard, Olivier; Celano, Umberto; Paredis, Kristof; Wouters, Lennaert; Mitard, Jerome; Horiguchi, Naoto (2019)

A 3D electrical characterization of single stacking faults in InP by conductive-AFM

Mannarino, Manuel; Celano, Umberto; Lu, Augustin; Chintala, Ravi Chandra; Paredis, Kristof; Vandervorst, Wilfried (2015)

Advantages of high vacuum for electrical scanning probe microscopy

Ludwig, Jonathan; Mascaro, Marco; Celano, Umberto; van der Heide, Paul; Vandervorst, Wilfried; Paredis, Kristof (2019)

Advantages of high vacuum for electrical scanning probe microscopy

Ludwig, Jonathan; Mascaro, Marco; Celano, Umberto; Vandervorst, Wilfried; Paredis, Kristof (2019)

An innovative probe microscopy solution for measuring conductivity profiles in 3-dimensions

Celano, Umberto; Paredis, Kristof; Humphris, Andrew; Tedaldi, Matt; O'Sullivan, Connor Laharn; Hole, Patrick; Goulden, Jenny (2021)

APT tip shape imaging by SPM

Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried (2019)

Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques

Minj, Albert; Zhao, Ming; Bakeroot, Benoit; Paredis, Kristof; Wouters, Lennaert; Hantschel, Thomas; Decoutere, Stefaan (2021)

Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy

Wouters, Lennaert; Minj, Albert; Celano, Umberto; Hantschel, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2020)

Carrier profiling with Fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InP

Dixon-Luinenburg, Oberon; Celano, Umberto; Vandervorst, Wilfried; Paredis, Kristof (2019)

Characterization of grain boundaries and impact of plasma-induced patterned in 2D materials

Celano, Umberto; Virkki, Olli; Chiappe, Daniele; Heyne, Markus; Hoflijk, Ilse; Franquet, Alexis; Huyghebaert, Cedric; Paredis, Kristof; De Gendt, Stefan; Radu, Iuliana; Vandervorst, Wilfried (2017)

Combining electrical AFM techniques for the study of exfoliated MoS2 devices

Mascaro, Marco; Celano, Umberto; Balaji, Yashwanth; Ludwig, Jonathan; Paredis, Kristof; Asselberghs, Inge; Radu, Iuliana; Vandervorst, Wilfried (2018)

Combining TCAD and advanced metrology techniques to support device integration towards N3

Eyben, Pierre; De Keersgieter, An; Celano, Umberto; Wouters, Lennaert; Chiarella, Thomas; Ritzenthaler, Romain; Mertens, Hans; Richard, Olivier; Paredis, Kristof; Matagne, Philippe; Mitard, Jerome; Horiguchi, Naoto; Goux, Ludovic (2021)

Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

Minj, Albert; Geens, Karen; Liang, Hu; Han, Han; Noel, Celine; Bakeroot, Benoit; Paredis, Kristof; Zhao, Ming; Hantschel, Thomas; Decoutere, Stefaan (2023)