Browsing by author "Suhane, Amit"

Characterization and optimization of charge-trap based NAND flash memories

Suhane, Amit (2012-09)

Effect of high temperature annealing on tunnel oxide properties in TANOS devices

Arreghini, Antonio; Zahid, Mohammed; Van den Bosch, Geert; Suhane, Amit; Breuil, Laurent; Cacciato, Antonio; Van Houdt, Jan (2011)

Electron trap profiling near Al2O3/ gate interface in TANOS stack using gate-side-trap spectroscopy by charge injection and sensing

Zahid, Mohammed; Arreghini, Antonio; Degraeve, Robin; Govoreanu, Bogdan; Suhane, Amit; Van Houdt, Jan (2010)

Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories

Suhane, Amit; Arreghini, Antonio; Van den Bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan (2010)

Experimental evaluation of trapping efficiency in silicon nitride based charge trapping memories

Suhane, Amit; Arreghini, Antonio; Van den Bosch, Geert; Breuil, Laurent; Cacciato, Antonio; Rothschild, Aude; Jurczak, Gosia; Van Houdt, Jan; De Meyer, Kristin (2009)

First-principles study of oxygen and aluminum defects in $b-Si3N4: Compensation and charge trapping

Grillo, Maria Elena; Elliott, Simon D.; Rodriguez, Jesus; Anez, Rafael; Coll, David Santiago; Suhane, Amit; Breuil, Laurent; Arreghini, Antonio; Degraeve, Robin; Shariq, Ahmed; Beyer, Volkhard; Czernohorsky, Malte (2014)

High performance THANVaS memories for MLC charge trap NAND flash

Suhane, Amit; Van den Bosch, Geert; Arreghini, Antonio; Breuil, Laurent; Cacciato, Antonio; Zahid, Mohammed; Debusschere, Ingrid; De Meyer, Kristin; Van Houdt, Jan (2011)

Investigation of rare-earth aluminates as alternative trapping materials in flash memories

Cacciato, Antonio; Suhane, Amit; Richard, Olivier; Arreghini, Antonio; Adelmann, Christoph; Swerts, Johan; Rothschild, Aude; Van den Bosch, Geert; Breuil, Laurent; Bender, Hugo; Jurczak, Gosia; Debusschere, Ingrid; Kittl, Jorge; Van Houdt, Jan (2010)

Investigation on the temperature dependence of the dielectric constant of high-k materials for non-volatile memory applications

Arreghini, Antonio; Suhane, Amit; Van den Bosch, Geert; Breuil, Laurent; De Meyer, Kristin; Jurczak, Gosia; Van Houdt, Jan (2010)

Optimization of the crystallization phase of rare-earth aluminates for blocking dielectric application in TANOS type Flash memories

Breuil, Laurent; Adelmann, Christoph; Van den Bosch, Geert; Cacciato, Antonio; Zahid, Mohammed; Toledano Luque, Maria; Suhane, Amit; Arreghini, Antonio; Degraeve, Robin; Van Elshocht, Sven; Debusschere, Ingrid; Kittl, Jorge; Jurczak, Gosia; Van Houdt, Jan (2010)

Quantitative and predictive model of reading current variability in deeply scaled vertical poly-Si channel for 3D memories

Toledano Luque, Maria; Degraeve, Robin; Kaczer, Ben; Tang, B.; Roussel, Philippe; Weckx, Pieter; Franco, Jacopo; Arreghini, Antonio; Suhane, Amit; Kar, Gouri Sankar; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan (2012)

Rare-earth aluminates as a charge trapping materials for NAND Flash memories: Integration and electrical evaluation

Suhane, Amit; Cacciato, Antonio; Richard, Olivier; Arreghini, Antonio; Adelmann, Christoph; Swerts, Johan; Rothschild, Aude; Van den Bosch, Geert; Breuil, Laurent; Bender, Hugo; Jurczak, Gosia; Debusschere, Ingrid; Kittl, Jorge; De Meyer, Kristin; Van Houdt, Jan (2011)