Browsing by author "Willander, M."

A method to interpret micro-Raman experiments made to measure nonuniform stresses: application to local oxidation of silicon structures

Pinardi, Kuntjoro; Jain, Suresh; Willander, M.; Atkinson, A.; Maes, Herman; Van Overstraeten, Roger (1998)

A review of recent work on stresses and strains in semiconductor heterostructures

Jain, Suresh; Willander, M.; Pinardi, Kuntjoro; Maes, Herman (1997)

A unified model for the space charge limited currents (SCLC) in organic materials combining trapping and field dependent mobility

Jain, Suresh; Mehra, Anupama; Geens, Wim; Aernouts, Tom; Poortmans, Jef; Mertens, Robert; Kumar, Vikram; Willander, M. (2001)

Advances in organic blue and green light sources: comparison with gaN- and ZnSe-based devices

Jain, Suresh; Geens, Wim; Poortmans, Jef; Heremans, Paul; Nijs, Johan; Mertens, Robert; Willander, M. (1999)

Advances in organic blue and green light sources: comparison with gaN- and ZnSe-based devices

Jain, Suresh; Geens, Wim; Poortmans, Jef; Heremans, Paul; Nijs, Johan; Mertens, Robert; Willander, M. (2000)

Behaviour of Poly-Si1-XGex-gated MOS capacitors under different electrical stress conditions in the direct tunnelling regime

Yousif, M. Y. A.; Willander, M.; Lundgren, P.; Caymax, Matty (2001)

Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers

Pinardi, Kuntjoro; Jain, Uma; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M. (1998)

Depth profiling of strain using micro-Raman measurements

Atkinson, A.; Jain, Suresh; Maes, Herman; Pinardi, Kuntjoro; Willander, M. (2001)

Dislocations in GaN/sapphire films: their distribution and effect on stress and optical properties

Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1998)

Effect of elastic constants on the stresses in stripes and substrates: a 2D FE calculation

Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Van Overstraeten, Roger; Willander, M. (1998)

Electrical stress characteristics of MOS capacitors with p-type poly-SiGe and poly-Si gates in the direct tunneling regime

Yousif, M. Y. A.; Willander, M.; Lundgren, P.; Caymax, Matty (2000)

Formation of epitaxial CoSi2 film on Si1-xGex(100) by reactive deposition epitaxy of Co1-xTix layer

Peto, G.; Molnar, G.; Kotai, E.; Dezsi, I.; Karlsteen, M.; Södervall, U.; Willander, M.; Caymax, Matty; Loo, Roger (2001)

Formation of epitaxial CoSi2 films on Si and on Si/Si80Ge20 (100) by reactive deposition epitaxy

Peto, G.; Molnar, G.; Kotai, E.; Dezsi, I.; Karsteen, M.; Sodervall, U.; Willander, M.; Caymax, Matty; Loo, Roger (2002)

High field effects on J/V characteristics in conducting polymers

Kumar, Vikram; Jain, Suresh; Kapoor, Ashok Kumar; Geens, Wim; Aernouts, Tom; Mehra, Anupama; Poortmans, Jef; Mertens, Robert; Willander, M. (2002)

III-nitrides: growth, characterization, and properties

Jain, Suresh; Willander, M.; Narayan, J.; Van Overstraeten, Roger (2000)

Injection- and space charge limited-currents in doped conducting organic materials

Jain, Suresh; Geens, Wim; Mehra, Anupama; Kumar, Vikram; Aernouts, Tom; Poortmans, Jef; Mertens, Robert; Willander, M. (2001)

Low temperature electrical performance of ultrathin oxide MOS capacitors with p+ poly-Si1-xGex and poly-Si gate materials

Jacob, A. P.; Myrberg, T.; Yousif, M. Y. A.; Nur, O.; Willander, M.; Lundgren, P.; Sveinbjörnson, E. Ö.; Caymax, Matty (2002)