Browsing by author "Keller, Brion"
Now showing items 1-20 of 22
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3D design-for-test architecture
Marinissen, Erik Jan; Konijnenburg, Mario; Verbree, Jouke; Chi, Chun-Chuan; Deutsch, Sergej; Papameletis, Christos; Burgherr, Tobias; Shibin, Konstantin; Keller, Brion; Chickermane, Vivek; Goel, Sandeep K. (2019-03) -
A DfT architecture and tool flow for 3D-SICs with test data compression, embedded cores, and multiple towers
Papameletis, Christos; Keller, Brion; Chickermane, Vivek; Hamdioui, Said; Marinissen, Erik Jan (2015) -
At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs
Shibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan (2015-05) -
At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs
Shibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan (2015-05) -
At-Speed delay testing of inter-die connections of 2.5D- and 3D-SICs
Shibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan (2015-05) -
At-speed inter-die interconnect test in 2.5D- and 3D-SICs
Shibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan (2015-10) -
At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic
Shibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan (2015-11) -
Automated design-for-test for 2.5D and 3D SICs
Marinissen, Erik Jan; Konijnenburg, Mario; Deutsch, Sergej; Keller, Brion; Chickermane, Vivek; Mukherjee, Subhasish; Goel, Sandeep K. (2011-09) -
Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers
Papameletis, Christos; Keller, Brion; Chickermane, Vivek; Marinissen, Erik Jan; Hamdioui, Said (2013-05) -
Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers
Papameletis, Christos; Keller, Brion; Chickermane, Vivek; Marinissen, Erik Jan; Hamdioui, Said (2013) -
Automation of 3D DfT insertion and interconnect test generation
Deutsch, Sergej; Chickermane, Vivek; Keller, Brion; Konijnenburg, Mario; Marinissen, Erik Jan; Goel, Sandeep K. (2011) -
Automation of 3D-DfT insertion
Deutsch, Sergej; Chickermane, Vivek; Keller, Brion; Mukherjee, Subhasish; Konijnenburg, Mario; Marinissen, Erik Jan; Goel, Sandeep K. (2011-11) -
Automation of 3D-DfT insertion
Deutsch, Sergej; Chickermane, Vivek; Keller, Brion; Mukherjee, Subhasish; Konijnenburg, Mario; Marinissen, Erik Jan; Goel, Sandeep K. (2011-09) -
Automation of DfT for 3-D stacked die
Beyne, Eric; Konijnenburg, Mario; Marinissen, Erik Jan; Jensen, Lisa; Deutsch, Sergej; Chikermane, Vivek; Keller, Brion; Mukherjee, Subhasish; Goel, Sandeep (2011) -
Automation of DfT insertion and interconnect test generation for 3D stacked ICs
Deutsch, Sergej; Chickermane, Vivek; Keller, Brion; Konijnenburg, Mario; Marinissen, Erik Jan (2011-05) -
DfT architecture and ATPG for interconnect tests of JEDEC wide-IO DRAM memory-on-Logic 2.5D/3D-stacks
Deutsch, Sergej; Chickermane, Vivek; Keller, Brion; Mukherjee, Subhasish; Sood, Navdeep; Marinissen, Erik Jan (2012-05) -
DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks
Deutsch, Sergej; Keller, Brion; Chickermane, Vivek; Mukherjee, Subhasish; Sood, Navdeep; Goel, Sandeep K.; Chen, Ji-Jan; Mehta, Ashok; Lee, Frank; Marinissen, Erik Jan (2012-11) -
DfT insertion and interconnect test generation for 3D stacks with JEDEC wide-IO DRAM
Deutsch, Sergej; Keller, Brion; Chickermane, Vivek; Goel, Sandeep K.; Marinissen, Erik Jan (2012-05) -
Extension of a 3D-DfT architecture for embedded cores and multiple towers
Papameletis, Christos; Chickermane, Vivek; Keller, Brion; Marinissen, Erik Jan (2012) -
Implementation aspects of a 3D DfT architecture
Deutsch, Sergej; Chickermane, Vivek; Keller, Brion; Mukherjee, Subhasish; Konijnenburg, Mario; Marinissen, Erik Jan (2011)