Browsing by author "Sedky, Sherif"
Now showing items 1-20 of 42
-
Analysis of the structural properties of polycrystalline silicon germanium films
Sedky, Sherif; Fiorini, Paolo; Loreti, S.; Caymax, Matty; Baert, Kris; Van Hoof, Chris (1999) -
Backside thinned CMOS imagers with high broadband quantum efficiency realised using a new integration process
De Munck, Koen; Bogaerts, Jan; Sabuncuoglu Tezcan, Deniz; De Moor, Piet; Sedky, Sherif; Van Hoof, Chris (2008) -
Bi2Te3 as an active material for MEMS based devices fabricated at room temperature
Sedky, Sherif; Kamal, Ahmed; Yomn, Mohannad; Bakr, Hassan; Ghannam, Rami; Leonov, Vladimir; Fiorini, Paolo (2009) -
Characterization and optimization of infrared SiGe bolometers
Sedky, Sherif; Fiorini, Paolo; Baert, Kris; Hermans, Lou; Mertens, Robert (1999) -
Characterization of bolometers based on polycrystalline silicon germanium alloys
Sedky, Sherif; Fiorini, Paolo; Caymax, Matty; Baert, Kris; Hermans, Lou; Mertens, Robert (1998) -
CMOS-based sensors and actuators
Van Steenkiste, Filip; Maes, David; Haspeslagh, Luc; Sedky, Sherif; Van Gerwen, Peter; van der Groen, Sonja; Baert, Kris (1998) -
CMOS-based transducers
Baert, Kris; Maes, David; Haspeslagh, Luc; Laureyn, Wim; Sedky, Sherif; van der Groen, Sonja; Van Gerwen, Peter; Van Steenkiste, Filip (1998) -
Contact resistivity of laser annealed SiGe for MEMS structural layers deposited at 210C
El Rifai, Joumana; Witvrouw, Ann; Abdel Aziz, Ahmed; Puers, Bob; Van Hoof, Chris; Sedky, Sherif (2011) -
Contact resistivity of laser annealed SiGe for MEMS structural layers deposited at 210C
El Rifai, Joumana; Sedky, Sherif; Abdel Aziz, Ahmed; Puers, Bob; Van Hoof, Chris; Witvrouw, Ann (2010) -
Effect of deposition and annealing temperature on the structural and mechanical properties of poly SiGe
Sedky, Sherif; Witvrouw, Ann; Caymax, Matty; Roussel, Philippe (2000) -
Effect of deposition and annealing temperature on the structural and mechanical properties of poly SiGe
Sedky, Sherif; Witvrouw, Ann; Caymax, Matty; Roussel, Philippe (2001) -
Effect of in situ boron doping on properties of silicon germanium films deposited by chemical vapor deposition at 400 degrees C
Sedky, Sherif; Witvrouw, Ann; Saerens, Annelies; Van Houtte, P.; Poortmans, Jef; Baert, Kris (2001) -
Experimental determination of the maximum post-process annealing temperature for standard CMOS wafers
Sedky, Sherif; Witvrouw, Ann; Bender, Hugo; Baert, Kris (2001) -
Harsh laser annealing techniques for improved crystallization of a-Si(Ge) layers deposited at 210C
El Rifai, Joumana; Witvrouw, Ann; Abdel Aziz, Ahmed; Puers, Bob; Van Hoof, Chris; Sedky, Sherif (2009) -
IR bolometers made of polycrystalline silicon germanium
Sedky, Sherif; Fiorini, Paolo; Caymax, Matty; Verbist, Agnes; Baert, Kris (1998) -
IR micro bolometers, made of polycrystalline silicon germanium alloys
Sedky, Sherif; Fiorini, Paolo; Caymax, Matty; Verbist, Agnes; Baert, Kris; Hermans, Lou (1997) -
Laser annealed SiGe devices for MEMS applications at temperatures below 250C
El Rifai, Joumana; Sedky, Sherif; Van Hoof, Rita; Severi, Simone; Lin, Dennis; Puers, Bob; Van Hoof, Chris; Witvrouw, Ann (2011) -
Laser-induced crystallization of SiGe MEMS structural layers deposited at temperatures below 250C
El Rifai, Joumana; Sedky, Sherif; Wasfi, Rami; Van Hoof, Chris; Witvrouw, Ann (2009) -
Linear arrays of uncooled poly SiGe microbolometers for IR detection
De Moor, Piet; Sedky, Sherif; Sabuncuoglu Tezcan, Deniz; Van Hoof, Chris (1999)