Browsing by author "Chuang, Kent"
Now showing items 1-11 of 11
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A cautionary note when looking for a truly reconfigurable resistive RAM PUF
Chuang, Kent; Degraeve, Robin; Fantini, Andrea; Groeseneken, Guido; Linten, Dimitri; Verbauwhede, Ingrid (2018) -
A multi-bits/cell PUF using analog breakdown positions in CMOS
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Kallstenius, Thomas; Groeseneken, Guido; Linten, Dimitri; Verbauwhede, Ingrid (2018) -
A physically unclonable function featuring 0% BER using soft oxide breakdown positions in 40nm CMOS
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Linten, Dimitri; Verbauwhede, Ingrid (2018) -
A physically unclonable function using soft oxide breakdown featuring 0% native BER and 51.8fJ/bit in 40nm CMOS
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Linten, Dimitri; Verbauwhede, Ingrid (2019) -
Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space
Bury, Erik; Vaisman Chasin, Adrian; Chuang, Kent; Vandemaele, Michiel; Van Beek, Simon; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2019) -
Physically unclonable function using CMOS breakdown positions
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Groeseneken, Guido; Verbauwhede, Ingrid; Linten, Dimitri (2017) -
Recent insights in CMOS reliability characterization by the use of degradation maps
Bury, Erik; Vaisman Chasin, Adrian; Kaczer, Ben; Chuang, Kent; Franco, Jacopo; Simicic, Marko; Weckx, Pieter; Linten, Dimitri (2018) -
Security and reliability: friend or foe?
Verbauwhede, Ingrid; Chuang, Kent (2019) -
Self-heating-aware CMOS reliability characterization using degradation maps
Bury, Erik; Vaisman Chasin, Adrian; Kaczer, Ben; Chuang, Kent; Franco, Jacopo; Simicic, Marko; Weckx, Pieter; Linten, Dimitri (2018) -
Statistical assessment of the full VG/VD degradation space using dedicated device arrays
Bury, Erik; Kaczer, Ben; Chuang, Kent; Franco, Jacopo; Weckx, Pieter; Vaisman Chasin, Adrian; Simicic, Marko; Linten, Dimitri; Groeseneken, Guido (2017) -
X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices
Wang, Pengfei; Zhang, Enxia; Chuang, Kent; Liao, Wenjun; Gong, Huiqi; Wang, Pan; Arutt, Charles N; Ni, Kai; McCurdy, Mike; Verbauwhede, Ingrid; Bury, Erik; Linten, Dimitri; Fleetwood, Daniel; Schrimpf, Ron; Reed, Robert (2018)