Browsing by author "Sangameswaran, Sandeep"
Now showing items 1-20 of 25
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A detailed study of a novel wafer separation method for surface sensitive MEMS wafers
Malachowski, Karl; Severi, Simone; Van Hoof, Rita; Sangameswaran, Sandeep; Witvrouw, Ann; Genda, Satoshi; Tabuchi, Tomotaka; Uchiyama, Naoki (2011) -
A silicon-controlled rectifier-based ESD protection for MEMS – Merits and challenges
Sangameswaran, Sandeep; Thijs, Steven; Scholz, Mirko; De Coster, Jeroen; Linten, Dimitri; Groeseneken, Guido; De Wolf, Ingrid (2011) -
A study of breakdown mechanisms in electrostatic actuators using mechanical response under EOS-ESD stress
Sangameswaran, Sandeep; De Coster, Jeroen; Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Van Hoof, Chris; De Wolf, Ingrid; Groeseneken, Guido (2009) -
An integrated measurement set-up to study the impact of atmosphere on ESD in MEMS
Sangameswaran, Sandeep; De Coster, Jeroen; Cherman, Vladimir; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; De Wolf, Ingrid; Groeseneken, Guido (2010) -
Applications of laser vibrometry during MEMS device qualification
De Coster, Jeroen; Sangameswaran, Sandeep; De Wolf, Ingrid (2009) -
Applications of laser-Doppler vibrometry during MEMS device qualification
De Coster, Jeroen; Sangameswaran, Sandeep; De Wolf, Ingrid (2010) -
Behavior of RF MEMS switches under ESD stress
Sangameswaran, Sandeep; De Coster, Jeroen; Cherman, Vladimir; Czarnecki, Piotr; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Groeseneken, Guido; De Wolf, Ingrid (2010) -
Design and fabrication of SiGe MEMS structures with high intrinsic ESD robustness
Sangameswaran, Sandeep; De Coster, Jeroen; Witvrouw, Ann; Groeseneken, Guido; De Wolf, Ingrid (2012) -
Electro static discharge in MEMS: sensitivity and protection
Sangameswaran, Sandeep (2008) -
Electrostatic discharge (ESD) in microelectromechanical systems (MEMS): sensitivity and protection
Sangameswaran, Sandeep (2011-12) -
ESD in MEMS: sensitivity and protection
Sangameswaran, Sandeep (2007) -
ESD issues in MEMS: a case study in micromirrors
Sangameswaran, Sandeep; De Coster, Jeroen; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Haspeslagh, Luc; Witvrouw, Ann; Van Hoof, Chris; Groeseneken, Guido; De Wolf, Ingrid (2008) -
ESD on-wafer characterization: Is TLP still the right measurement tool?
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep; Sawada, Masanori; Nakaie, T.; Hasebe, Takumi; Groeseneken, Guido (2009-10) -
ESD reliability issues in microelectromechanical systems (MEMS): A case study on micromirrors
Sangameswaran, Sandeep; De Coster, Jeroen; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Haspeslagh, Luc; Witvrouw, Ann; Van Hoof, Chris; Groeseneken, Guido; De Wolf, Ingrid (2008) -
ESD-protection of advanced RF and broadband integrated circuits and MEMS
Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep (2010) -
Impact of design factors and environment on the electrostatic discharge sensitivity of MEMS micromirrors
Sangameswaran, Sandeep; De Coster, Jeroen; Groeseneken, Guido; De Wolf, Ingrid (2010) -
Integrated measurement set-up for ESD in MEMS
Sangameswaran, Sandeep (2009) -
Investigating ESD sensitivity in electrostatic SiGe MEMS
Sangameswaran, Sandeep; De Coster, Jeroen; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Groeseneken, Guido; De Wolf, Ingrid (2010) -
Mechanical response of electrostatic actuators under ESD stress
Sangameswaran, Sandeep; De Coster, Jeroen; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Van Hoof, Chris; De Wolf, Ingrid; Groeseneken, Guido (2009) -
New methods and instrumentation for functional, yield and reliability testing of MEMS on device, chip and wafer level
De Wolf, Ingrid; De Coster, Jeroen; Cherman, Vladimir; Czarnecki, Piotr; Kalicinski, Stanislaw; Varela Pedreira, Olalla; Sangameswaran, Sandeep; Vanstreels, Kris (2009)