Browsing by author "Gilbert, Matthieu"
Now showing items 21-40 of 40
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Dopant/carrier profiling in nanostructures
Vandervorst, Wilfried; Eyben, Pierre; Schulze, Andreas; Mody, Jay; Koelling, Sebastian; Kambham, Ajay Kumar; Gilbert, Matthieu (2010) -
field evaporation behavior of high-k metal gate stack under femtosecond laser pulsing
Gilbert, Matthieu; Koelling, Sebastian; Kambham, Ajay Kumar; Vandervorst, Wilfried (2010) -
Field evaporation of semiconductors under femtosecond laser illumination
Koelling, Sebastian; Gilbert, Matthieu; Vandervorst, Wilfried (2009) -
FIM observation of dopants in silicon
Gilbert, Matthieu; Koelling, Sebastian; Vandervorst, Wilfried (2009) -
HfSiO bulk trap density controls the initial Vth in nMOSFETs
Sahhaf, Sahar; Degraeve, Robin; Srividya, Vydia; De Brabanter, K.; Schram, Tom; Gilbert, Matthieu; Vandervorst, Wilfried; Groeseneken, Guido (2012-06) -
High depth resolution analysis of Si/SiGe multilayers with the atom probe
Koelling, Sebastian; Gilbert, Matthieu; Goossens, Jozefien; Hikavyy, Andriy; Richard, Olivier; Vandervorst, Wilfried (2009) -
Impact of the apex of an elongated dielectric tip upon its light absorption properties
Bogdanowicz, Janusz; Gilbert, Matthieu; Koelling, Sebastian; Vandervorst, Wilfried (2014) -
In-situ observation of non-hemispherical tip shape formation during laser-assisted Atom Probe Tomography
Koelling, Sebastian; Gilbert, Matthieu; Kambham, Ajay Kumar; Innocenti, Nicolas; Vandervorst, Wilfried (2010) -
Ion-implantation-based low-cost Hk/MG process for CMOS low-power application
Ortolland, Claude; Sahhaf, Sahar; Srividya, Vidya; Degraeve, Robin; Saino, Kanta; Kim, Chul-Sung; Gilbert, Matthieu; Kauerauf, Thomas; Cho, Moon Ju; Dehan, Morin; Schram, Tom; Togo, Mitsuhiro; Horiguchi, Naoto; Groeseneken, Guido; Biesemans, Serge; Absil, Philippe; Vandervorst, Wilfried; Gealy, Dan; Hoffmann, Thomas Y. (2010) -
Laser-assisted atom probe tomography of semiconductors: the impact of the focused-ion beam specimen preparation
Bogdanowicz, Janusz; Kumar, Arul; Fleischmann, Claudia; Gilbert, Matthieu; Houard, Jonathan; Vella, Angela; Vandervorst, Wilfried (2018) -
Light absorption in conical silicon particles
Bogdanowicz, Janusz; Gilbert, Matthieu; Koelling, Sebastian; Innocenti, Nicolas; Vanderheyden, Benoit; Vandervorst, Wilfried (2013) -
Nanoscale analysis of planar and 3D-Si-structures
Vandervorst, Wilfried; Eyben, Pierre; Polspoel, Wouter; Mody, Jay; Gilbert, Matthieu; Koelling, Sebastian (2009) -
(Non-hemispherical) apex shape formation and (non-uniform) apex temperature distribution during laser-assisted atomprobe tomography of semiconductors
Bogdanowicz, Janusz; Kumar, Arul; Melkonyan, Davit; Arnoldi, Laurent; Fleischmann, Claudia; Morris, Richard; Vella, Angela; Gilbert, Matthieu; Jonathan, Houard; Vandervorst, Wilfried (2016) -
On the locally resonant absorption of light in semiconducting tips during laser-assisted Atom Probe Tomography
Bogdanowicz, Janusz; Koelling, Sebastian; Gilbert, Matthieu; Kumar, Arul; Demeulemeester, Jelle; Bran, Julien; Melkonyan, Davit; Vandervorst, Wilfried (2014) -
Quantitative depth profiling of SiGe-multilayers with the atom probe
Koelling, Sebastian; Gilbert, Matthieu; Goossens, Jozefien; Hikavyy, Andriy; Richard, Olivier; Vandervorst, Wilfried (2011) -
Quantitative depth profiling of SiGe-multilayers with the atomprobe
Koelling, Sebastian; Gilbert, Matthieu; Vandervorst, Wilfried (2009) -
Reneutralization time of surface silicon ions on a field emitter
Mazumder, Baishaki; Vella, Angela; Gilbert, Matthieu; Deconihout, Bernard; Schimtz, Guido (2010) -
Specifics of cross-section analyses on semiconductor multi-layers
Koelling, Sebastian; Gilbert, Matthieu; Innocenti, Nicolas; Kambham, Ajay Kumar; Vandervorst, Wilfried (2010) -
Thickness and composition measurements of nanoelectronics multilayer thin films by energy dispersive spectroscopy (EDS)
Franquet, Alexis; Conard, Thierry; Gilbert, Matthieu; Hantschel, Thomas; Vandervorst, Wilfried (2013) -
Thin SiGe films in narrow structures: comparison of different analysis techniques for the thickness and composition measurements
Franquet, Alexis; Conard, Thierry; Gilbert, Matthieu; Douhard, Bastien; Vandervorst, Wilfried (2012)