Browsing by author "Martens, Koen"
Now showing items 21-40 of 147
-
Capacitance-voltage characterization of GaAs-Oxide interfaces
Brammertz, Guy; Lin, Dennis; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
Brammertz, Guy; Martens, Koen; Sioncke, Sonja; Delabie, Annelies; Caymax, Matty; Meuris, Marc; Heyns, Marc (2007-09) -
Characteristics of surface states and charge neutrality level in Ge
Kuzum, Duygu; Martens, Koen; Krishnamohan, Tejas; Saraswat, Krishna (2009) -
Charge pumping characterization of germanium MOSFETs
Martens, Koen; Kaczer, Ben; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2007) -
CMOS-compatible selective biofunctionalization using a patterned sacrificial layer approach
Ha, Seungkyu; Vos, Rita; Vidal Cabanilles, Maria; Martens, Koen; Stakenborg, Tim; Van Dorpe, Pol; Jans, Karolien (2019) -
Computational assessment of the feasibility of protonation-based protein sequencing
Miclotte, Giles; Martens, Koen; Fostier, Jan (2020-09) -
Contact resistivity and Fermi-level pinning in n-type Ge contacts with epitaxial Si-passivation
Martens, Koen; Rooyackers, Rita; Firrincieli, Andrea; Vincent, Benjamin; Loo, Roger; De Jaeger, Brice; Meuris, Marc; Favia, Paola; Bender, Hugo; Douhard, Bastien; Vandervorst, Wilfried; Simoen, Eddy; Jurczak, Gosia; Wouters, Dirk; Kittl, Jorge (2011) -
Contact technology schemes for advanced Ge and III-V CMOS technologies
Claeys, Cor; Firrincieli, Andrea; Martens, Koen; Kittl, Jorge; Simoen, Eddy (2012) -
Controlling surface-enhanced charge screening to realize single-molecule sensing with silicon FET sensors
Santermans, Sybren; Martens, Koen (2020) -
Crystallization and semiconductor-metal switching behavior of thin VO2 layers grown by atomic layer deposition
Rampelberg, Geert; Deduytsche, Davy; De Schutter, Bob; Peter, Antony; Toeller, Michael; Schaekers, Marc; Martens, Koen; Radu, Iuliana; Detavernier, Christophe (2014) -
Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Dou, Chunmeng; Lin, Dennis; Vais, Abhitosh; Ivanov, Tsvetan; Chen, Han-Ping; Martens, Koen; Kakushima, Kuniyuki; Iwai, Hiroshi; Taur, Yuan; Thean, Aaron; Groeseneken, Guido (2014) -
Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices
Martens, Koen; Wang, Wenfei; dimoulas, A.; Borghs, Gustaaf; Meuris, Marc; Groeseneken, Guido; Maes, Herman (2007) -
Development of an aqueous vanadium precursor for the chemical solution deposition of V2O5 films
Peys, Nick; Dewulf, Daan; Schellens, Kevin; Martens, Koen; D'Haen, Jan; De Gendt, Stefan; Hardy, An; Van Bael, Marlies (2010) -
Electric field-induced carrier accumulation at the vanadium dioxide - dielectric interface
Martens, Koen; Jeong, Jaewoo; Phani, Aetukuri; Esfahani, Davoud; Peeters, Francois; Moshchalkov, Victor; Van de Vondel, Joris; Charles, Rettner; Douhard, Bastien; Vandervorst, Wilfried; Mahesh, Samant; Parkin, Stuart (2014) -
Electrical and reliability characterization of metal-gate/HfO2/Ge FET's with Si passivation
Kaczer, Ben; De Jaeger, Brice; Nicholas, Gareth; Martens, Koen; Degraeve, Robin; Houssa, Michel; Pourtois, Geoffrey; Leys, Frederik; Meuris, Marc; Groeseneken, Guido (2007) -
Electrical characterization and modeling of Ge/III-V - dielectric interfaces
Martens, Koen (2009-01) -
Electrical characterization of leaky charge-trapping high-k MOS devices using pulsed Q-V
Martens, Koen; Rosmeulen, Maarten; Kaczer, Ben; Groeseneken, Guido; Maes, Herman (2007-05) -
Electrical characterization of Si capped Hf)2/metal gate Ge-pFETs: physical insight into critical parameters
Mitard, Jerome; Vincent, Benjamin; De Jaeger, Brice; Martens, Koen; Krom, Raymond; Loo, Roger; Eneman, Geert; De Meyer, Kristin; Meuris, Marc; Heyns, Marc; Vandervorst, Wilfried; Caymax, Matty; Hoffmann, Thomas Y. (2010) -
Electrical characterization of the metal-vanadium dioxide interface and implications for memory applications
Martens, Koen; Radu, Iuliana; Mertens, Sofie; Shi, Xiaoping; Schaekers, Marc; Tielens, Hilde; Huyghebaert, Cedric; De Gendt, Stefan; Jurczak, Gosia; Afanasev, Valeri; Heyns, Marc; Kittl, Jorge (2011) -
Electrical characterization of the metal-vanadium dioxide interface and vanadium dioxide work function
Martens, Koen; Radu, Iuliana; Mertens, Sofie; Shi, Xiaoping; Schaekers, Marc; Tielens, Hilde; Huyghebaert, Cedric; De Gendt, Stefan; Jurczak, Gosia; Afanas'ev, Valerie; Heyns, Marc; Kittl, Jorge (2011)