Browsing by author "Bury, Erik"
Now showing items 21-40 of 75
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Cyclic Thermal Effects on Devices of Two-Dimensional Layered Semiconducting Materials
Kim, Yeonsu; Kaczer, Ben; Verreck, Devin; Grill, Alexander; Kim, Doyoon; Song, Jaeick; Diaz Fortuny, Javier; Vici, Andrea; Park, Jongseon; Van Beek, Simon; Simicic, Marko; Bury, Erik; Vaisman Chasin, Adrian; Linten, Dimitri; Lee, Jaewoo; Chun, Jungu; Kim, Seongji; Seo, Beumgeun; Choi, Junhee; Shim, Joon Hyung; Lee, Kookjin; Kim, Gyu-Tae (2021) -
Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Vandemaele, Michiel; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2022) -
Defect-centric perspective of combined BTI and RTN time-dependent variability
Weckx, Pieter; Kaczer, Ben; Franco, Jacopo; Roussel, Philippe; Bury, Erik; Subirats, Alexandre; Groeseneken, Guido; Catthoor, Francky; Linten, Dimitri; Raghavan, Praveen; Thean, Aaron (2015) -
Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets
Bury, Erik; Vaisman Chasin, Adrian; Kaczer, Ben; Vandemaele, M.; Tyaginov, S.; Franco, Jacopo; Ritzenthaler, Romain; Mertens, Hans; Weckx, Pieter; Horiguchi, Naoto; Linten, Dimitri (2022) -
Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations
Bury, Erik; Kaczer, Ben; Van Beek, Simon; Linten, Dimitri (2018) -
Experimental validation of self-heating simulations in transistors in deeply scaled nodes
Bury, Erik; Kaczer, Ben; Roussel, Philippe; Ritzenthaler, Romain; Raleva, Katerina; Vasileska, Dragica; Groeseneken, Guido (2014) -
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
Zhao, S. E.; Putcha, Vamsi; Bury, Erik; Franco, Jacopo; Walke, Amey; Peralagu, Uthayasankaran; Zhao, Ming; Alian, AliReza; Kaczer, Ben; Waldron, Niamh; Linten, Dimitri; Parvais, Bertrand; Collaert, Nadine (2020) -
External I/O interfaces in sub-5nm GAA NS Technology and STCO Scaling Options
Chen, Wen Chieh; Chen, Shih-Hung; Hellings, Geert; Bury, Erik; Simicic, Marko; Wu, Zhicheng; Van der Plas, Geert; Beyne, Eric; Groeseneken, Guido (2021) -
First-principles 3D thermal simulation of microscale devices
Vermeersch, Bjorn; Mingo, Natalio; Bury, Erik; Pourtois, Geoffrey; Oprins, Herman; Nejim, Ahmed (2017) -
Full (Vg,Vd) bias space modeling of hot-carrier degradation in nanowire FETs
Vandemaele, Michiel; Kaczer, Ben; Tyaginov, Stanislav; Stanojevic, Zlatan; Makarov, Alexander; Vaisman Chasin, Adrian; Bury, Erik; Mertens, Hans; Linten, Dimitri; Groeseneken, Guido (2019) -
Guidelines for reducing NBTI based on its correlation with effective work function studied by CV-BTI on high-k first MOS capacitors with slant etched SiO2
Arimura, Hiroaki; Ragnarsson, Lars-Ake; Schram, Tom; Albert, Johan; Kaczer, Ben; Degraeve, Robin; Bury, Erik; Aoulaiche, Marc; Kauerauf, Thomas; Thean, Aaron; Horiguchi, Naoto; Groeseneken, Guido (2014) -
Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space
Franco, Jacopo; Kaczer, Ben; Vaisman Chasin, Adrian; Bury, Erik; Linten, Dimitri (2018) -
Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer
Alian, Alireza; Rodriguez, Raul; Yadav, Sachin; Peralagu, Uthayasankaran; Sibaja-Hernandez, Arturo; Putcha, Vamsi; Zhao, Ming; ElKashlan, Rana Y.; Vermeersch, Bjorn; Yu, Hao; Bury, Erik; Khaled, Ahmad; Collaert, Nadine; Parvais, Bertrand (2022) -
Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM
Van Beek, Simon; Martens, Koen; Roussel, Philippe; Couet, Sebastien; Souriau, Laurent; Swerts, Johan; Kim, Woojin; Rao, Siddharth; Mertens, Sofie; Lin, Tsann; Crotti, Davide; Degraeve, Robin; Bury, Erik; Linten, Dimitri; Kar, Gouri Sankar; Groeseneken, Guido (2017) -
Impact of self-heating on reliability predictions in STT-MRAM
Van Beek, Simon; O'Sullivan, Barry; Roussel, Philippe; Degraeve, Robin; Bury, Erik; Swerts, Johan; Couet, Sebastien; Souriau, Laurent; Kundu, Shreya; Rao, Siddharth; Kim, Woojin; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation
Diaz Fortuny, Javier; Sangani, Dishant; Saraza Canflanca, Pablo; Bury, Erik; Degraeve, Robin; Kaczer, Ben (2023) -
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations
Vandemaele, Michiel; Kaczer, Ben; Bury, Erik; Franco, Jacopo; Vaisman Chasin, Adrian; Makarov, Alexander; Mertens, Hans; Hellings, Geert; Groeseneken, Guido (2023-05-15) -
Investigation of correlated trap sites in SILC, BTI and RTN in SiON and HKMG devices
Bury, Erik; Degraeve, Robin; Cho, Moon Ju; Kaczer, Ben; Goes, Wolfang; Grasser, Tibor; Groeseneken, Guido (2014) -
Low-power DRAM-compatible replacement gate high-k/metal gate stacks
Ritzenthaler, Romain; Schram, Tom; Bury, Erik; Mitard, Jerome; Ragnarsson, Lars-Ake; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Caillat, Christian; Srividya, Vidya; Fazan, Pierre (2012) -
Low-power DRAM-compatible replacement gate high-k/metal gate stacks
Ritzenthaler, Romain; Schram, Tom; Bury, Erik; Spessot, Alessio; Caillat, Christian; Srividya, Vidya; Sebaai, Farid; Mitard, Jerome; Ragnarsson, Lars-Ake; Groeseneken, Guido; Horiguchi, Naoto; Fazan, Pierre; Thean, Aaron (2013)