Browsing by author "Gräf, D."
Now showing items 21-30 of 30
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Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon
Rotondaro, Antonio; Hurd, Trace; Mertens, Paul; Schmidt, Harald; Heyns, Marc; Simoen, Eddy; Vanhellemont, Jan; Vegh, Gerzson; Claeys, Cor; Gräf, D. (1994) -
On the impact of grown-in silicon oxide precipitate nuclei on silicon gate oxide integrity
Vanhellemont, Jan; Kissinger, G.; Kenis, Karine; Depas, Michel; Gräf, D.; Lambert, U.; Wagner, Patrick (1996) -
On the impact of grown-in substrate defects and iron contamination on gate oxide integrity
Vanhellemont, Jan; Kissinger, G.; Kenis, Karine; Depas, Michel; Gräf, D.; Lambert, U.; Wagner, Patrick (1996) -
On the nature of grown-in defects in silicon: dependence on pulling conditions and evolution during treatments
Vanhellemont, Jan; Kissinger, G.; Senkader, S.; Gräf, D.; Kenis, Karine; Depas, Michel; Lambert, U.; Wagner, Patrick (1996) -
Recombination activity of iron-related complexes in silicon studied with microwave and light-induced absorption techniques
Kaniava, Arvydas; Rotondaro, Antonio; Vanhellemont, Jan; Simoen, Eddy; Gaubas, Eugenijus; Vaitkus, J.; Hurd, Trace; Mertens, Paul; Claeys, Cor; Gräf, D. (1994) -
Statistical analysis of gate oxide integrity test
Mertens, Paul; Vermeire, Bert; Depas, Michel; Meuris, Marc; Heyns, Marc; Gräf, D. (1994) -
Ultra clean processing technologies: advanced si-surface preparation techniques
Heyns, Marc; Meuris, Marc; Mertens, Paul; Hurd, Trace; Schmidt, Harald; Verhaverbeke, Steven; Hatcher, Z.; Gräf, D. (1994) -
Ultra Clean Processing Technologies: Advanced Si-Surface Preparation Techniques
Heyns, Marc; Meuris, Marc; Mertens, Paul; Hurd, Trace; Schmidt, Harald; Verhaverbeke, Steven; Hatcher, Z.; Gräf, D. (1994) -
Ultra clean processing technology for highly reliable gate oxides
Heyns, Marc; Meuris, Marc; Mertens, Paul; Schmidt, Harald; Verhaverbeke, Steven; Bender, Hugo; Vandervorst, Wilfried; Caymax, Matty; Rotondaro, Antonio; Hatcher, Z.; Gräf, D. (1994) -
Ultra thin gate oxide technology and reliability
Heyns, Marc; Depas, Michel; Teerlinck, Ivo; Meuris, Marc; Mertens, Paul; Vanhellemont, Jan; Mouche, Laurent; Nigam, Tanya; Wilhelm, Rudi; Knotter, Martin; Wolke, K.; Crossley, A.; Sofield, C. J.; Gräf, D. (1996)