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Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM ( a-VMCO) by RTN and CVS techniques for memory window improvement
Publication:
Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM ( a-VMCO) by RTN and CVS techniques for memory window improvement
Date
2016
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ma, Jigang
;
Chai, Zheng
;
Zhang, Weidong
;
Govoreanu, Bogdan
;
Zhang, Jiang F.
;
Ji, Z.
;
Benbakhti, B.
;
Groeseneken, Guido
;
Jurczak, Malgorzata
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1984
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1984
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations