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Investigation of Microwave Loss Induced by Oxide Regrowth in High-Q Niobium Resonators
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Authors
Verjauw, Jeroen
;
Potocnik, Anton
;
Mongillo, Massimo
;
Acharya, Rohith
;
Mohiyaddin, Fahd Ayyalil
;
Simion, George
;
Pacco, Antoine
;
Ivanov, Tsvetan
;
Wan, Danny
;
Vanleenhove, Anja
;
Souriau, Laurent
;
Jussot, Julien
;
Thiam, Arame
;
Swerts, Johan
;
Piao, Xiaoyu
;
Couet, Sebastien
;
Heyns, Marc
;
Govoreanu, Bogdan
;
Radu, Iuliana
DOI
10.1103/PhysRevApplied.16.014018
ISSN
2331-7019
Issue
1
Journal
PHYSICAL REVIEW APPLIED
Volume
16
Title
Investigation of Microwave Loss Induced by Oxide Regrowth in High-Q Niobium Resonators
Publication type
Journal article
Embargo date
9999-12-31
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3
20.500.12860/37727.3
*
2022-06-09T07:27:20Z
validation by library/open access desk
2
20.500.12860/37727.2
2022-05-06T06:04:07Z
validation by imec author
1
20.500.12860/37727
2021-11-02T15:58:54Z
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