Browsing Conference contributions by title

Quality parameters as modeling language abstractions for context-aware applications: An AAL case study

Hoyos, Jose Ramon; Preuveneers, Davly; García-Molina, Jesus J. (2017)

Quality versus cost analysis for 3D stacked ICs

Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2014-04)

Quality-Aware Compression of Point Clouds with Google Draco

de Hoog, Jens; Ahmed, Ahmed; Anwar, Ali; Latre, Steven; Hellinckx, Peter (2022)

Quality-of-experience in wireless multi-standard multi-media: a design-time/run-time cross-layer approach

Eberle, Wolfgang; Bougard, Bruno; Pollin, Sofie; Blanch, Carolina; Lenoir, Gregory (2005-03)

Quality-of-service in BAN: PER reduction and its trade-offs

Masse, Fabien; Penders, Julien (2010)

Quantification of B and As depth profiles with resonant post-ionisation mass spectrometry

De Bisschop, Peter; Gomez, Jose Ignacio; Vandervorst, Wilfried (1997)

Quantification of blood velocity from time-resolved CT angiography on a 256-slice CT

Buls, Nico; De Brucker, Y.; Devos, H.; Aerden, Dimitri; Van Gompel, Gert; Boonen, Pieter; Nieboer, K.; De Mey, Johan (2018)

Quantification of elements at the Si/SiO2-interface

Janssens, Tom; Vandervorst, Wilfried (2000)

Quantification of group IV alloys in confined structures: the self focusing SIMS approach

Franquet, Alexis; Douhard, Bastien; Melkonyan, Davit; Delmotte, Joris; Demeulemeester, Jelle; Conard, Thierry; Vandervorst, Wilfried (2014)

Quantification of high-K nanolayers for semiconductor applications using synchrotron radiation and calibrated instrumentation

Mueller, Matthias; Hoenicke, Philipp; Detlefs, Blanka; Fleischmann, Claudia; Vandervorst, Wilfried; Beckhoff, Burkhard (2014)

Quantification of local and regional orientation of outgrowing neurites

Prodanov, Dimiter; Micholt, Liesbeth; Braeken, Dries; Bartic, Carmen; Eberle, Wolfgang (2010)

Quantification of nano-spreading resistance profiling data

De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried (1997)

Quantification of process-induced damage in highly-scaled pMTJ devices for MRAM applications

Rao, Siddharth; Perumkunnil, Manu; Kundu, Shreya; Souriau, Laurent; Swerts, Johan; Couet, Sebastien; Yasin, Farrukh; Kim, Woojin; Tsvetanova, Diana; Jossart, Nico; Crotti, Davide; Furnemont, Arnaud; Kar, Gouri Sankar (2018)

Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability

Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2016)

Quantification of shot noise contributions to contact hole local CD non-uniformity

Gronheid, Roel; Winroth, Gustaf; Vaglio Pret, Alessandro; Younkin, Todd (2012)

Quantifying internal optical losses for 21% n-Si rear junction cells

Duerinckx, Filip; Aleman, Monica; Choulat, Patrick; Kuzma Filipek, Izabela; Cornagliotti, Emanuele; Szlufcik, Jozef (2014)

Quantifying LER and its impact on BEOL TDDB reliability at 20nm ½ pitch

Demuynck, Steven; Roussel, Philippe; Stucchi, Michele; Versluijs, Janko; Gishia, Gianni; Tokei, Zsolt; De Roest, David; Beyer, Gerald (2010)

Quantifying motion artifacts using a rotating Phantom: insights towards dynamic musculoskeletal applications

Keelson, Benymeen; Buzzatti, Luca; Lopez, Violeta Portero; Scheerlink, Thierry; Van Gompel, Gert; Cattrysse, Erik; de Mey, Johan; Vandemeulebroucke, Jef; Buls, Nico (2020)

Quantifying the benefits of selective wavelength regeneration in ultra long-haul WDM networks

Van Parys, Wim; Arijs, Peter; Antonis, O.; Demeester, Piet (2001)

Quantifying the impact of optical interconnect latency on the performance of optoelectronic FPGAs

Dambre, Joni; Van Marck, H.; Van Campenhout, Jan (1999)