Browsing Conference contributions by title

Radiation damage in deep submicron partially depleted SOI CMOS

Simoen, Eddy; Rafi, Joan Marc; Mercha, Abdelkarim; Serra-Gallifa, Xavier; van Meer, Hans; De Meyer, Kristin; Claeys, Cor; Kokkoris, M.; Kossionides, E.; Fanourakis, G. (2003)

Radiation damage in npn Si transistors due to high-temperature gamma-ray and 1-MeV electron irradiation

Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, Cor; Nakabayashi, M.; Onoda, S. (2002)

Radiation damage in shallow trench isolation diodes

Hayama, K.; Ohyama, H.; Miura, T.; Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Kobayashi, K. (2001)

Radiation damage induced in Si photodiodes by high-temperature neutron irradiation

Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takakura, K.; Matsuoko, H.; Jono, T.; Uemura, J.; Kishikawa, T. (2002)

Radiation damage of In0.53Ga0.47As photodiodes by high energy particles

Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Kudou, T.; Sunaga, H. (1998)

Radiation damage of InGaAs photodiodes by high energy particles

Ohyama, Hidenori; Kudou, T.; Simoen, Eddy; Claeys, C.; Takami, Y.; Shigaki, K.; Fujii, A.; Sunaga, H (1998)

Radiation damage of InGaAsP laser diodes by high-temperature gamma ray and electron irradiation

Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, C.; Kudou, T.; Onoda, S. (2001)

Radiation damage of MOSFETs by high-temperature electron irradiation

Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2002)

Radiation damage of n-MOSFETs fabricated in a BiCMOS process

Ohyama, Hidenori; Kobayashi, K.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Yoneoka, M.; Hayama, Kiyoteru; Takizawa, H.; Kohiki, S. (2000)

Radiation damages of InGaP p-HEMTs by high energy particles

Ohyama, Hidenori; Simoen, Eddy; Kuroda, S.; Claeys, Cor; Takami, Y.; Sunaga, H. (1998)

Radiation damages of Si avalanche photodiodes by 1-MeV fast neutrons and 220-MEV carbon particles

Ohyama, Hidenori; Hakata, T.; Simoen, Eddy; Claeys, C.; Takami, Y.; Hayama, J.; Tokuyama, J.; Shigaki, K.; Sunaga, H.; Miyahara, K.; Hososhima, M. (1998)

Radiation damages of SiGe devices by electron irradiation and their thermally recovery bahavior

Nakashima, T.; Idemoto, T.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Ohyama, H.; Yoshino, K.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Eneman, Geert; Claeys, Cor (2010)

Radiation defects and carrier lifetime in tin-doped n-type silicon

Simoen, Eddy; Claeys, Cor; Kraitchinskii, A. M.; Kras'ko, M. M.; Neimash, V. B.; Shpinar, L. I. (2002)

Radiation effects in CMOS active pixel sensors

Bogaerts, Jan; Dierickx, Bart; Van Hoof, Chris (2000)

Radiation effects on low temperature electronics

Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2004)

Radiation effects on polycrystalline silicon films

Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Tanaka, K.; Kobayashi, K. (2001)

Radiation hardness aspects of advanced FinFET and UTBOX devices

Claeys, Cor; Aoulaiche, Marc; Simoen, Eddy; Griffoni, Alessio; Kobayashi, D.; Mahatme, N.N.; Reed, R.A.; Schrimpf, R.D.; Agopian, P.G.D.; Martino, J.A. (2012)

Radiation hardness of Al(x)Ga(1-x)N photodetectors exposed to Extreme UltraViolet (EUV) light beam

Malinowski, Pawel; John, Joachim; Lorenz, Anne; Cheng, Kai; Derluyn, Joff; Germain, Marianne; De Moor, Piet; Minoglou, Kiki; Barkusky, Frank; Bayer, Armin; Mann, Klaus; Duboz, Jean-Yves; Semond, Fabrice; Hochedez, Jean-Francois; Giordanengo, Boris; Borghs, Gustaaf; Mertens, Robert (2009)

Radiation hardness of SiGe and Ge-based CMOS technologies

Claeys, Cor; Iacvo, C.; Mitard, Jerome; Arora, R.; Zhang, C.; Galloway, K.; Fleetwood, D.; Schrimpf, R.; Poizat, M.; Simoen, Eddy (2011)

Radiation induced defects InGaAs photodiodes by 1-MeV fast neutrons

Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Vanhellemont, Jan; Kudou, T.; Takami, Y.; Sunaga, H. (1997)