Browsing Conference contributions by imec author "5f830f45512a5ff6804177d907d87c55a2452508"
Now showing items 21-40 of 41
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Lateral versus vertical gate-all-around FETs for beyond 7nm technologies
Yakimets, Dmitry; Huynh Bao, Trong; Garcia Bardon, Marie; Dehan, Morin; Collaert, Nadine; Mercha, Abdelkarim; Tokei, Zsolt; Thean, Aaron; Verkest, Diederik; De Meyer, Kristin (2014) -
Layout-induced stress effects in 14nm & 10nm FinFETs and their impact on performance
Garcia Bardon, Marie; Moroz, Victor; Eneman, Geert; Schuddinck, Pieter; Dehan, Morin; Yakimets, Dmitry; Jang, Doyoung; Van der Plas, Geert; Mercha, Abdelkarim; Thean, Aaron; Verkest, Diederik; Steegen, An (2013) -
Logic scaling assessment in 20nm and beyond under electrical and litho constraints
Badaroglu, Mustafa; Garcia Bardon, Marie; Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel (2012) -
Low track height standard cell design in iN7 using scaling boosters
Sherazi, Yasser; Jha, Chaitanya; Rodopoulos, Dimitrios; Debacker, Peter; Chava, Bharani; Mattii, Luca; Garcia Bardon, Marie; Schuddinck, Pieter; Raghavan, Praveen; Gerousis, V.; Spessot, Alessio; Verkest, Diederik; Mocuta, Anda; Kim, Ryan Ryoung han; Ryckaert, Julien (2017) -
MEMS in post-processed standard CMOS
Garcia Bardon, Marie; Pereira Neves, Hercules; Puers, Bob; Van Hoof, Chris (2008) -
Physical insights on steep slope FEFETs including nucleation-propagation and charge trapping
Xiang, Yang; Garcia Bardon, Marie; Alam, Md Nur Kutubul; Thesberg, Mischa; Kaczer, Ben; Roussel, Philippe; Popovici, Mihaela Ioana; Ragnarsson, Lars-Ake; Truijen, Brecht; Verhulst, Anne; Parvais, Bertrand; Horiguchi, Naoto; Groeseneken, Guido; Van Houdt, Jan (2019) -
Power aware FinFET and lateral nanosheet FET targeting for 3nm CMOS technology
Yakimets, Dmitry; Garcia Bardon, Marie; Jang, Doyoung; Schuddinck, Pieter; Sherazi, Yasser; Weckx, Pieter; Miyaguchi, Kenichi; Parvais, Bertrand; Raghavan, Praveen; Spessot, Alessio; Verkest, Diederik; Mocuta, Anda (2017) -
Power-performance trade-offs for lateral nanosheets on ultra-scaled standard cells
Garcia Bardon, Marie; Sherazi, Yasser; Jang, Doyoung; Yakimets, Dmitry; Schuddinck, Pieter; Baert, Rogier; Mertens, Hans; Mattii, Luca; Parvais, Bertrand; Mocuta, Anda; Verkest, Diederik (2018) -
Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes
Kukner, Halil; Weckx, Pieter; Franco, Jacopo; Toledano Luque, Maria; Cho, Moon Ju; Kaczer, Ben; Raghavan, Praveen; Jang, Doyoung; Miyaguchi, Kenichi; Garcia Bardon, Marie; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Self-heating on bulk FinFET from 14nm down to 7nm node
Jang, Doyoung; Bury, Erik; Ritzenthaler, Romain; Garcia Bardon, Marie; Chiarella, Thomas; Miyaguchi, Kenichi; Raghavan, Praveen; Mocuta, Anda; Groeseneken, Guido; Mercha, Abdelkarim; Verkest, Diederik; Thean, Aaron (2015) -
Si1-xGex-channel PFETs: scalability, layout considerations and compatibility with other stress techniques
Eneman, Geert; Hellings, Geert; Mitard, Jerome; Witters, Liesbeth; Yamaguchi, Shinpei; Garcia Bardon, Marie; Christie, Phillip; Ortolland, Claude; Hikavyy, Andriy; Favia, Paola; Bargallo Gonzalez, Mireia; Simoen, Eddy; Crupi, Felice; Kobayashi, Masaharu; Franco, Jacopo; Takeoka, Shinji; Krom, Raymond; Bender, Hugo; Loo, Roger; Claeys, Cor; De Meyer, Kristin; Hoffmann, Thomas Y. (2011) -
Stacked nanosheet fork architecture for SRAM design and device co-optimization toward 3nm
Weckx, Pieter; Ryckaert, Julien; Putcha, Vamsi; De Keersgieter, An; Boemmels, Juergen; Schuddinck, Pieter; Jang, Doyoung; Yakimets, Dmitry; Garcia Bardon, Marie; Ragnarsson, Lars-Ake; Raghavan, Praveen; Kim, Ryan Ryoung han; Spessot, Alessio; Verkest, Diederik; Mocuta, Anda (2017) -
Standard cell level parasitics assessment in 20nm BPL and 14nm BFF
Schuddinck, Pieter; Badaroglu, Mustafa; Stucchi, Michele; Demuynck, Steven; Hikavyy, Andriy; Garcia Bardon, Marie; Mercha, Abdelkarim; Mallik, Arindam; Chiarella, Thomas; Kubicek, Stefan; Athimulam, Raja; Collaert, Nadine; Horiguchi, Naoto; Debusschere, Ingrid; Thean, Aaron; Altimime, Laith; Verkest, Diederik (2012) -
STI and eSiGe source/drain stressors induced stress modeling in 28 nm technology with replacement gate (RMG) process
Jang, Doyoung; Garcia Bardon, Marie; Yakimets, Dmitry; Miyaguchi, Kenichi; De Keersgieter, An; Chiarella, Thomas; Ritzenthaler, Romain; Dehan, Morin; Mercha, Abdelkarim (2013) -
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
Garcia-Redondo, F.; Rao, Siddharth; Gupta, Mohit; Perumkunnil, Manu; Xiang, Yang; Abdi, Dawit; Van Beek, Simon; Couet, Sebastien; Garcia Bardon, Marie (2023) -
The Environmental Impact of CMOS Logic Technologies
Ragnarsson, Lars-Ake; Garcia Bardon, Marie; Wuytens, Pieter; Mirabelli, Gioele; Jang, Doyoung; Willems, Geert; Mallik, Arindam; Spessot, Alessio; Ryckaert, Julien; Parvais, Bertrand (2022) -
The impact of sequential-3D integration on semiconductor scaling roadmap
Mallik, Arindam; Vandooren, Anne; Witters, Liesbeth; Walke, Amey; Franco, Jacopo; Sherazi, Yasser; Weckx, Pieter; Yakimets, Dmitry; Garcia Bardon, Marie; Parvais, Bertrand; Debacker, Peter; Ku, B.W.; Lim, S.K.; Mocuta, Anda; Mocuta, Dan; Ryckaert, Julien; Collaert, Nadine; Raghavan, Praveen (2017) -
Trap-aware compact modeling and power-performance assessment of III-V tunnel FET
Xiang, Yang; Yakimets, Dmitry; Sant, Saurabh; Memisevic, Elvedin; Garcia Bardon, Marie; Verhulst, Anne; Parvais, Bertrand; Schenk, Andreas; Wernersson, Lars-Erik; Groeseneken, Guido (2018-10) -
Understanding the memory window in 1T-FeFET memories: a depolarization field perspective
Kaczmarek, Kuba; Garcia Bardon, Marie; Xiang, Yang; Breuil, Laurent; Ronchi, Nicolo; Parvais, Bertrand; Groeseneken, Guido; Van Houdt, Jan (2021) -
Variability and technology aware SRAM product yield maximization
Zuber, Paul; Miranda Corbalan, Miguel; Garcia Bardon, Marie; Cosemans, Stefan; Roussel, Philippe; Dobrovolny, Petr; Chiarella, Thomas; Horiguchi, Naoto; Mercha, Abdelkarim; Hoffmann, Thomas Y.; Verkest, Diederik; Biesemans, Serge (2011)