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imec Publications Repository
imec Publications
Conference contributions
Recent submissions
imec Publications Repository
imec Publications
Conference contributions
Recent submissions
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Conference contributions: Recent submissions
Now showing items 5741-5760 of 20249
Personalized robotic intervention strategy by using semantics for people with dementia in nursing homes
Ongenae, Femke
;
De Backere, Femke
;
Mahieu, Christof
;
De Pestel, Stijn
;
Nelis, Jelle
;
Simoens, Pieter
;
De Turck, Filip
(
2017-05
)
Low temperature influence on long channel STI last process relaxed and strained Ge pFinFETs
Oliveira, Alberto
;
Agopian, Paula
;
Martino, Joao
;
Simoen, Eddy
;
Mitard, Jerome
;
Witters, Liesbeth
;
Collaert, Nadine
;
Claeys, Cor
(
2017
)
High lateral electric field impact on the performance of Si-platform-based Ge pFinFETs
Oliveira, Alberto
;
Agopian, Paula GD
;
Martino, Joao Antonio
;
Simoen, Eddy
;
Mitard, Jerome
;
Witters, Liesbeth
;
Collaert, Nadine
;
Claeys, Cor
(
2017
)
Experimental comparison between relaxed and strained Ge pFinFETs
Oliveira, Alberto
;
Agopian, P.G.D.
;
Martino, Joao A.
;
Simoen, Eddy
;
Mitard, Jerome
;
Witters, Liesbeth
;
Collaert, Nadine
;
Claeys, Cor
(
2017
)
Thermomechanical aspects of wafer-to-wafer copper-dielectric hybrid bonding for 3D integrated circuits
Okudur, Oguzhan Orkut
;
De Messemaeker, Joke
;
Salahouelhadj, Abdellah
;
Gonzalez, Mario
;
Zahedmanesh, Houman
;
Varela Pedreira, Olalla
;
Kim, Soon-Wook
;
Vanstreels, Kris
;
Beyne, Eric
;
De Wolf, Ingrid
(
2017
)
Variability study with CD-SEM metrology for STT-MRAM: correlation analysis between physical dimensions and electrical property of the memory element
Ohashi, Takeyoshi
;
Yamaguchi, Atsuko
;
Hasumi, Kazuhisa
;
Inoue, Osamu
;
Ikota, Masami
;
Lorusso, Gian
;
Donadio, Gabriele Luca
;
Yasin, Farrukh
;
Rao, Siddharth
;
Kar, Gouri Sankar
(
2017
)
3D measurement of 3D NAND memory hole with CD-SEM and tilted FIB
Ohashi, Takeyoshi
;
Yamaguchi, Atsuko
;
Hasumi, Kazuhisa
;
Ikota, Masami
;
Tan, Chi Lim
;
Raymaekers, Tom
;
Van den Bosch, Geert
;
Furnemont, Arnaud
;
Lorusso, Gian
(
2017
)
Variability study with CD-SEM metrology for STT-MRAM: Correlation analysis between physical dimensions and electrical property of the memory element
Ohashi, Takeyoshi
;
Yamaguchi, Atusko
;
Hasumi, Kazuhisa
;
Inoue, Osamu
;
Ikata, Masami
;
Lorusso, Gian
;
Donadio, Gabriele Luca
;
Yasin, Farrukh
;
Rao, Siddharth
;
Kar, Gouri Sankar
(
2017
)
ALD aluminum oxide as a hole selective tunneling contact for crystalline silicon solar cells
Ogutitman, Kortan
;
Davis, Kristopher O.
;
Schoenfeld, Winston V.
;
Haslinger, Michael
;
Robert, Sofie
;
Cornagliotti, Emanuele
;
John, Joachim
(
2017
)
Impact of hydrogen peroxide in ultrapure water
Ogawa, Yuichi
;
Masaoka, Toru
;
Gan, Nobuko
;
Fujimura, Yu
;
Minato, Yasuharu
;
Miyazaki, Yoichi
;
Wostyn, Kurt
;
Pacco, Antoine
;
Holsteyns, Frank
;
Yoshida, Yukifumi
(
2017
)
How unique is your .onion? An analysis of the fingerprintability of Tor onion services
Oberdorf, Rebekah
;
Juarez, Marc
;
Acar, Gunes
;
Greenstadt, Rachel
;
Diaz, Claudia
(
2017
)
Occlusion robust symbol level fusion for multiple people tracking
Nyan, Bo Bo
;
Veelaert, Peter
;
Philips, Wilfried
(
2017
)
Nanoscale stress measurements through advanced Raman spectroscopy
Nuytten, Thomas
;
Bogdanowicz, Janusz
;
Hantschel, Thomas
;
Schulze, Andreas
;
Favia, Paola
;
Bender, Hugo
;
De Wolf, Ingrid
;
Vandervorst, Wilfried
(
2017
)
Authentic execution of distributed event-driven applications with a small TCB
Noorman, Jan
;
Mühlberg, Jan Tobias
;
Piessens, Frank
(
2017
)
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point
Noltsis, Michalis
;
Maragkoudaki, Eleni
;
Rodopoulos, Dimitrios
;
Catthoor, Francky
;
Soudris, Dimitrios
(
2017
)
Thermo-mechanical finite element simulation of a sub-cell utilising wire interconnection
Nivelle, Philippe
;
Daenen, Michael
;
Voroshazi, Eszter
;
de Haen, Jan
;
Poortmans, Jef
(
2017
)
Deep learning sparse ternary projections for compressed sensing of images
Nguyen, Duc Minh
;
Tsiligianni, Evaggelia
;
Deligiannis, Nikos
(
2017
)
New methods for the design of smart products : project based learning with industry
Neutens, Tom
;
Saldien, Jelle
;
Verstockt, Steven
;
Wyffels, Francis
(
2017-09
)
High-throughput multi-beam SEM: quantitative analysis of imaging capabilities at imec-N10 logic node
Neumann, J.T.
;
Garbowski, T.
;
Högele, W.
;
Korb, T.
;
Halder, Sandip
;
Leray, Philippe
;
Garreis, R.
;
le Maire, M.
;
Zeidler, D.
(
2017
)
Fluorescent diamond probes: charge sensing and intracellular delivery
Nesladek, Milos
;
Gulka, Michal
(
2017
)
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