Recently added

Fabrication of single-crystalline, high-performance organic thin film transistors by edge blade coating

Janneck, Robby; Rolin, Cedric; Genoe, Jan; Heremans, Paul (2015)

Self-heating on bulk FinFET from 14nm down to 7nm node

Jang, Doyoung; Bury, Erik; Ritzenthaler, Romain; Garcia Bardon, Marie; Chiarella, Thomas; Miyaguchi, Kenichi; Raghavan, Praveen; Mocuta, Anda; Groeseneken, Guido; Mercha, Abdelkarim; Verkest, Diederik; Thean, Aaron (2015)

Ground plane influence on UTBB SOI nMOSFET analog parameters

Itocazu, Vitor; Sonnenberg, Victor; Simoen, Eddy; Claeys, Cor; Martino, Joao (2015)

Threshold voltage modeling for DT UTBB SOI in different operation modes

Itocazu, Vitor T.; Sasaki, Katia; Manini, M.B.; Sonnenberg, Victor; Martino, Joao A.; Simoen, Eddy; Claeys, Cor (2015)

Collaborative work on reducing the intersite gaps in outgassing qualification

Inoue, Soichi; Shiobara, Eishi; Sasami, Takeshi; Takagi, Isamu; Kikuchi, Yukiko; Fujimori, Toru; Minegishi, Shinya; Berg, Robert; Lucatorto, Thomas; Hill, Shannon; Tanio, Charles; Pollentier, Ivan; Lin, Yen-Chih; Fan, Yu-Jen; Ashworth, Dominic (2015)

Glyoxylic acid as reducing agent for electroless copper deposition on cobalt liner

Inoue, Fumihiro; Philipsen, Harold; van der Veen, Marleen; Van Huylenbroeck, Stefaan; Armini, Silvia; Struyf, Herbert; Shingubara, Shoso; Tanaka, Tetsu (2015)

Development of glyoxylic acid based electroless copper deposition on ruthenium

Inoue, Fumihiro; Philipsen, Harold; van der Veen, Marleen; Van Huylenbroeck, Stefaan; Armini, Silvia; Struyf, Herbert; Shingubara, Shoso; Tanaka, Tetsu (2015)

Influence of precursor gas source on defect properties in Si1xGex epitaxial thin films

Ike, Shinichi; Simoen, Eddy; Shimura, Yosuke; Hikavyy, Andriy; Vandervorst, Wilfried; Loo, Roger; Takeuchi, Wakana; Nakatsuka, Osamu; Zaima, Shigeaki (2015)

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

Ike, Shinichi; Simoen, Eddy; Shimura, Yosuke; Hikavyy, Andriy; Vandervorst, Wilfried; Loo, Roger; Takeuchi, Wakana; Nakatsuka, Osamu; Zaima, Shigeaki (2015)

Design technology co-optimization for enabling 5nm gate-all-around nanowire 6T SRAM

Huynh Bao, Trong; Sakhare, Sushil; Ryckaert, Julien; Yakimets, Dmitry; Mercha, Abdelkarim; Verkest, Diederik; Thean, Aaron; Wambacq, Piet (2015)

Reliability aware simulation flow: from TCAD calibration to circuit level analysis

Hussin, Razzaidi; Gerrer, Louis; Ding, Jie; Amaroso, Salvatore; Wang, Liping; Simicic, Marko; Weckx, Pieter; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015)

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow

Hussin, Razaidi; Gerrer, Louis; Ding, Jie; Wang, Liping; Amoroso, Salvatore; Cheng, Binjie; Weckx, Pieter; Simicic, Marko; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015)

TCAD-based methodology for reliability assessment of nanoscaled MOSFETs

Hussin, Razaidi; Gerrer, Louis; Amoroso, Salvatore; Wang, Liping; Weckx, Pieter; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015)

A new paradigm for in-line detection and control of patterning defects

Hunsche, Stefan; Jochemsen, Marinus; Jain, Vivek; Zhou, Xinjian; Chen, Frank; Vellanki, Venu; Spence, Chris; Halder, Sandip; Van Den Heuvel, Dieter; Truffert, Vincent (2015)

Investigation of trapping effects on Au-free AlGaN/GaN Schottky diodes fabricated on C-doped buffer layers

Hu, Jie; Stoffels, Steve; Lenci, Silvia; You, Shuzhen; Bakeroot, Benoit; Ronchi, Nicolo; Venegas, Rafael; Groeseneken, Guido; Decoutere, Stefaan (2015)

MBE growth of BaTiO3 on Ge/Si and SrTiO3/Si pseudosubstrates for electro-optical modulators integration on silicon

Hsu, Mark; Pantouvaki, Marianna; Merckling, Clement; El Kazzi, Salim; Van Campenhout, Joris; Absil, Philippe; Van Thourhout, Dries (2015)

SAMs (self-assembled monolayers) passivation of Cobalt microbumps for 3D applications

Hou, Lin; Derakhshandeh, Jaber; Armini, Silvia; Gerets, Carine; De Preter, Inge; Rebibis, Kenneth June; Miller, Andy; De Wolf, Ingrid; Beyne, Eric (2015)

Determination of thickness and density of a wet multilayer polymer system with sub-nanometer resolution by means of a dual polarization silicon-on-insulator microring

Hoste, Jan-Willem; De Geest, Bruno; Bienstman, Peter (2015)

High density optrode-electrode neural probe using SixNy photonics for in vivo optogenetics

Hoffman, Luis; Welkenhuysen, Marleen; Andrei, Alexandru; Musa, Silke; Luo, Zhenxiang; Libbrecht, Sarah; Severi, Simone; Soussan, Philippe; Baekelandt, Veerle; Haesler, Sebastian; Gielen, Georges; Puers, Bob; Braeken, Dries (2015)

Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach

Hoenicke, Philipp; Detlefs, Blanka; Fleischmann, Claudia; Vandervorst, Wilfried; Mueller, Matthias; Nolot, Emmanuel; Grampeix, Helen; Beckhoff, Burkhard (2015)

Conference contributions: Recent submissions

Fabrication of single-crystalline, high-performance organic thin film transistors by edge blade coating ﻿

Self-heating on bulk FinFET from 14nm down to 7nm node ﻿

Ground plane influence on UTBB SOI nMOSFET analog parameters ﻿

Threshold voltage modeling for DT UTBB SOI in different operation modes ﻿

Collaborative work on reducing the intersite gaps in outgassing qualification ﻿

Glyoxylic acid as reducing agent for electroless copper deposition on cobalt liner ﻿

Development of glyoxylic acid based electroless copper deposition on ruthenium ﻿

Influence of precursor gas source on defect properties in Si1xGex epitaxial thin films ﻿

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects ﻿

Design technology co-optimization for enabling 5nm gate-all-around nanowire 6T SRAM ﻿

Reliability aware simulation flow: from TCAD calibration to circuit level analysis ﻿

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow ﻿

TCAD-based methodology for reliability assessment of nanoscaled MOSFETs ﻿

A new paradigm for in-line detection and control of patterning defects ﻿

Investigation of trapping effects on Au-free AlGaN/GaN Schottky diodes fabricated on C-doped buffer layers ﻿

MBE growth of BaTiO3 on Ge/Si and SrTiO3/Si pseudosubstrates for electro-optical modulators integration on silicon ﻿

SAMs (self-assembled monolayers) passivation of Cobalt microbumps for 3D applications ﻿

Determination of thickness and density of a wet multilayer polymer system with sub-nanometer resolution by means of a dual polarization silicon-on-insulator microring ﻿

High density optrode-electrode neural probe using SixNy photonics for in vivo optogenetics ﻿

Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach ﻿