Recently added

A wearable and low-power bio-impedance monitor as a screening tool for sleep apnea

Smeets, C.J.P.; Lee, Seulki; Vandervoort, P.; Penders, Julien; Grieten, Lars (2013)

Si cap passivation for Ge nMOs applications

Sioncke, Sonja; Vanherle, Wendy; Art, Wim; Ceuppens, Joris; Ivanov, Tsvetan; Lin, Dennis; Delabie, Annelies; Conard, Thierry; Struyf, Herbert; De Gendt, Stefan; Caymax, Matty; Collaert, Nadine; Thean, Aaron (2013)

N-type silicon wafer screening for IBC solar cells by different thermal treatments

Singh, Sukhvinder; Debucquoy, Maarten; Wostyn, Kurt; Cornagliotti, Emanuele; O'Sullivan, Barry; Posthuma, Niels; Poortmans, Jef (2013)

HFCVD boron-doped diamond layers: influence of the initial growth stages and wire carburization

Simon, Daniel; Tsigkourakos, Menelaos; Hantschel, Thomas; Conard, Thierry; Vandervorst, Wilfried (2013)

Impact of oxide trap passivation by fluorine on the low-frequency noise behavior of gate-last pMOSFETs

Simoen, Eddy; Veloso, Anabela; Horiguchi, Naoto; Paraschiv, Vasile; Claeys, Cor (2013)

Analysis of border traps in high-k gate dielectrics on high-mobility channels

Simoen, Eddy; Lin, Dennis; Alian, AliReza; Brammertz, Guy; Merckling, Clement; Mitard, Jerome; Claeys, Cor (2013)

Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs

Simoen, Eddy; Lee, Jae Woo; Veloso, Anabela; Paraschiv, Vasile; Horiguchi, Naoto; Claeys, Cor (2013)

Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETs

Simoen, Eddy; Aoulaiche, Marc; Santos, Sara Deresste D.; Martino, Joao; Strobel, Vincent; Cretu, Bogdan; Routoure, Jean-Marc; Carin, Regis; Luque Rodriguez, Abraham; Jimenez Tejada, Juan Antonio; Claeys, Cor (2013)

GaN buffer design: electrical characterization and prediction of the effect of deep level centers in GaN/AlGaN HEMTS

Silvestri, Marco; Michael, Uren; Marcon, Denis; Kuball, Martin (2013)

CVD Mn-based self-formed barrier for advanced interconnect technology

Siew, Yong Kong; Jourdan, Nicolas; Barbarin, Yohan; Machillot, Jerome; Demuynck, Steven; Croes, Kristof; Tseng, J.; Ai, Hua; Tang, Jing; Naik, M.; Wang, P.; Narasimhan, M.; Abraham, M.; Cockburn, Andrew; Boemmels, Juergen; Tokei, Zsolt (2013)

Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x

Shimura, Yosuke; Wang, Wei; Nieddu, Thomas; Gencarelli, Federica; Vincent, Benjamin; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger (2013-06)

Theoretical and experimental investigation of the GeSn bandgap

Shimura, Yosuke; Wang, Wei; Gencarelli, Federica; Vincent, Benjamin; Nieddu, Thomas; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger (2013)

Increase responsivity in Ge1-xSnx QWs photodetectors

Shimura, Yosuke; Gencarelli, Federica; Vincent, Benjamin; Gassenq, Alban; Roelkens, Gunther; Van Campenhout, Joris; Vantomme, Andre; Loo, Roger (2013-03)

A 54-69.3 GHz dual band VCO with differential hybrid coupler for quadrature generation

Shi, Qixian; Mangraviti, Giovanni; Vaesen, Kristof; Parvais, Bertrand; Wambacq, Piet (2013)

Data memory optimization in LTE downlink

Sharma, Namita; Vander Aa, Tom; Agrawal, Prashant; Raghavan, Praveen; Panda, Preeti; Catthoor, Francky (2013-05)

Comparative study of stress inducing layers to produce kerfless thin wafers by the slim-cut technique

Serra, Joo Manuel; Bellanger, Pierre; Lobato, Killian; Martini, Roberto; Debucquoy, Maarten; Poortmans, Jef (2013)

Sub-meter UWB localization: low complexity design and evaluation in a real localization system

Selimis, Georgios; Romme, Jac; Pflug, Hans; Philips, Kathleen; Dolmans, Guido; de Groot, Harmke (2013)

Tunnel emission for Co and Cr related levels in p-type Ge

Segers, Siegfried; Lauwaert, Johan; Clauws, Paul; Simoen, Eddy; Vanhellemont, Jan; Callens, Freddy; Vrielinck, Henk (2013)

Dummy oxide removal in high-K last process integration how to avoid silicon corrosion issue

Sebaai, Farid; Veloso, Anabela; Takahashi,; Pacco, Antoine; Claes, Martine; Schaekers, Marc; De Gendt, Stefan; Mertens, Paul; Struyf, Herbert (2013)

AFM-based tomography for probing the electrical properties in confined volumes at the nanometer scale

Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Mody, Jay; Vandervorst, Wilfried (2013)

Conference contributions: Recent submissions

A wearable and low-power bio-impedance monitor as a screening tool for sleep apnea ﻿

Si cap passivation for Ge nMOs applications ﻿

N-type silicon wafer screening for IBC solar cells by different thermal treatments ﻿

HFCVD boron-doped diamond layers: influence of the initial growth stages and wire carburization ﻿

Impact of oxide trap passivation by fluorine on the low-frequency noise behavior of gate-last pMOSFETs ﻿

Analysis of border traps in high-k gate dielectrics on high-mobility channels ﻿

Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs ﻿

Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETs ﻿

GaN buffer design: electrical characterization and prediction of the effect of deep level centers in GaN/AlGaN HEMTS ﻿

CVD Mn-based self-formed barrier for advanced interconnect technology ﻿

Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x ﻿

Theoretical and experimental investigation of the GeSn bandgap ﻿

Increase responsivity in Ge1-xSnx QWs photodetectors ﻿

A 54-69.3 GHz dual band VCO with differential hybrid coupler for quadrature generation ﻿

Data memory optimization in LTE downlink ﻿

Comparative study of stress inducing layers to produce kerfless thin wafers by the slim-cut technique ﻿

Sub-meter UWB localization: low complexity design and evaluation in a real localization system ﻿

Tunnel emission for Co and Cr related levels in p-type Ge ﻿

Dummy oxide removal in high-K last process integration how to avoid silicon corrosion issue ﻿

AFM-based tomography for probing the electrical properties in confined volumes at the nanometer scale ﻿