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Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs
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Authors
Modolo, N.
;
Fregolent, M.
;
Masin, F.
;
Benato, A.
;
Bettini, A.
;
Buffolo, M.
;
De Santi, C.
;
Borga, Matteo
;
Posthuma, Niels
;
Bakeroot, Benoit
;
Decoutere, Stefaan
;
Vogrig, D.
;
Neviani, A.
;
Meneghesso, G.
;
Zanoni, E.
;
Meneghini, M.
DOI
10.1016/j.microrel.2022.114708
ISSN
0026-2714
Issue
November
Journal
MICROELECTRONICS RELIABILITY
Volume
138
Title
Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs
Publication type
Journal article
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Date
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2
20.500.12860/40951.2
*
2023-04-26T08:48:50Z
validation by library/open access desk
1
20.500.12860/40951
2023-01-09T03:12:33Z
*Selected version
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