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Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications
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Authors
Oh, Hyungrock
;
Belmonte, Attilio
;
Perumkunnil, Manu
;
Mitard, Jerome
;
Rassoul, Nouredine
;
Donadio, Gabriele Luca
;
Delhougne, Romain
;
Furnemont, Arnaud
;
Kar, Gouri Sankar
;
Dehaene, Wim
DOI
10.1109/ESSDERC53440.2021.9631811
EISBN
978-1-6654-3748-6
ISSN
1930-8876
Conference
IEEE 51st European Solid-State Device Research Conference (ESSDERC)
Journal
na
Title
Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications
Publication type
Proceedings paper
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Date
Summary
3
20.500.12860/41845.3
*
2023-08-10T08:55:37Z
validation by library/open access desk
1
20.500.12860/41845
2023-06-20T10:34:21Z
*Selected version
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